ltc6652ahms8-5-trpbf Linear Technology Corporation, ltc6652ahms8-5-trpbf Datasheet - Page 3

• Manufacturer Part Number: ltc6652ahms8-5-trpbf
• Description: Precision Low Drift Low Noise Buffered Reference
• Manufacturer: Linear Technology Corporation

ELECTRICAL CHARACTERISTICS
temperature range, otherwise specifi cations are at T
PARAMETER
Output Voltage
Output Voltage Temperature Coeffi cient
(Note 3)
Line Regulation
Load Regulation (Note 4)
Minimum Operating Voltage (Note 5)
Output Short-Circuit Current
Shutdown Pin (SHDN)
Supply Current
Shutdown Current
Output Voltage Noise (Note 6)
Turn-On Time
Long Term Drift of Output Voltage (Note 7)
Hysteresis (Note 8)
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime.
Note 2: If the parts are stored outside of the specifi ed temperature range,
the output may shift due to hysteresis.
Note 3: Temperature coeffi cient is measured by dividing the max change in
output voltage by the specifi ed temperature range.
Note 4: Load regulation is measured on a pulse basis from no load to the
specifi ed load current. Output changes due to die temperature change
must be taken into account separately.
Note 5: Excludes load regulation errors.
Note 6: Peak-to-peak noise is measured with a 3-pole highpass at 0.1Hz
and 4-pole lowpass fi lter at 10Hz. The unit is enclosed in a still-air
environment to eliminate thermocouple effects on the leads. The test
time is 10 seconds. RMS noise is measured on a spectrum analyzer in
a shielded environment where the intrinsic noise of the instrument is
removed to determine the actual noise of the device.
CONDITIONS
LTC6652A
LTC6652B
LTC6652A
LTC6652B
V
I
I
I
Short V
Short V
Logic High Input Voltage
Logic High Input Current
Logic Low Input Voltage
Logic Low Input Current
No Load
0.1Hz ≤ f ≤ 10Hz
10Hz ≤ f ≤ 1kHz
0.1% Settling
Δ
SINK
SOURCE
OUT
OUT
T
= –40°C to 125°C
= 5mA, V
+ 0.5V ≤ V
= 5mA
A
OUT
OUT
= 5mA
= 25°C, V
to GND
to V
OUT
The
IN
IN
Error ≤ 0.1%
≤ 13.2V, SHDN = V
l
IN
denotes the specifi cations which apply over the full operating
= V
OUT
Note 7: Long term stability typically has a logarithmic characteristic and
therefore, changes after 1000 hours tend to be much smaller than before
that time. Total drift in the second thousand hours is normally less than
one third that of the fi rst thousand hours with a continuing trend toward
reduced drift with time. Long-term stability will also be affected by
differential stresses between the IC and the board material created during
board assembly.
Note 8: Hysteresis in output voltage is created by package stress that
differs depending on whether the IC was previously at a higher or
lower temperature. Output voltage is always measured at 25°C, but
the IC is cycled to the hot or cold temperature limit before successive
measurements. Hysteresis is roughly proportional to the square of the
temperature change. For instruments that are stored at well controlled
temperatures (within 20 or 30 degrees of operational temperature) it’s
usually not a dominant error source.
+ 0.5V, unless otherwise noted.
IN
l
l
l
l
l
l
l
l
l
l
l
l
–0.05
MIN
–0.1
2.8
2
TYP
350
105
0.1
0.1
0.1
50
20
16
16
40
60
2
4
2
2
3
LTC6652
MAX
0.05
150
450
200
560
0.1
0.8
10
50
80
75
1
1
2
5
ppm/√khr
ppm/mA
ppm/mA
ppm/mA
ppm/mA
ppm
ppm/°C
ppm/°C
ppm
ppm/V
ppm/V
UNITS
3
ppm
6652f
RMS
mA
mA
P-P
μA
μA
μA
μA
μA
μs
%
%
V
V
V