nb3l553 ON Semiconductor, nb3l553 Datasheet - Page 3

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nb3l553

Manufacturer Part Number
nb3l553
Description
2.5 V / 3.3 V / 5.0 V 1 4 Clock Fanout Buffer
Manufacturer
ON Semiconductor
Datasheet

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Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. JEDEC standard multilayer board − 2S2P (2 signal, 2 power)
MAXIMUM RATINGS
Symbol
V
T
q
q
q
T
V
stg
DD
JA
JC
JA
A
I
Positive Power Supply
Input Voltage
Operating Temperature Range, Industrial
Storage Temperature Range
Thermal Resistance (Junction−to−Ambient)
Thermal Resistance (Junction−to−Case)
Thermal Resistance (Junction−to−Ambient)
ATTRIBUTES
2. For additional Moisture Sensitivity information, refer to Application Note AND8003/D.
ESD Protection
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 2)
Flammability Rating
Transistor Count
Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test
Parameter
Characteristic
http://onsemi.com
Oxygen Index: 28 to 34
Charged Device Model
NB3L553
Condition 1
GND = 0 V
Human Body Model
500 lfpm
500 lfpm
(Note 1)
0 lfpm
0 lfpm
3
Machine Model
Condition 2
SOIC−8
SOIC−8
DFN8
DFN8
UL−94 code V−0 @ 0.125 in
531 Devices
> TBD kV
GND –0.5 ≤ V
> 150 V
Level 1
> 2 kV
Value
≥ −40 to ≤ +85
−65 to +150
41 to 44
Rating
190
130
129
6.0
84
I
≤ V
DD
+ 0.5
Units
_C/W
_C/W
_C/W
_C/W
_C/W
_C
_C
V
V

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