nbxspa008 ON Semiconductor, nbxspa008 Datasheet - Page 4

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nbxspa008

Manufacturer Part Number
nbxspa008
Description
2.5 V / 3.3 V, 161.1328mhz Lvds Clock Oscillator
Manufacturer
ON Semiconductor
Datasheet
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
4. Measurement taken with outputs terminated with 100 ohm across differential pair. See Figure 4.
5. Parameter guarantees 10 years of aging. Includes initial stability at 25°C, shock, vibration and first year aging.
Table 6. AC CHARACTERISTICS
t
DUTY_CYCLE
Symbol
f
F
CLKOUT
t
t
OE/OD
t
t
NOISE
jit
jitter
start
Df
t
t
board with maintained transverse airflow greater than 500 Ifpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
(F)
R
F
Output Clock Frequency
Frequency Stability − NBXSPA008
Phase−Noise Performance
f
(See Figures 3 and NO TAG)
RMS Phase Jitter
Cycle to Cycle, RMS
Cycle to Cycle, Peak−to−Peak
Period, RMS
Period, Peak−to−Peak
Output Enable/Disable Time
Output Clock Duty Cycle
(Measured at Cross Point)
Output Rise Time (20% and 80%)
Output Fall Time (80% and 20%)
Start−up Time
Aging
CLKout
= 161.1328 MHz
Characteristic
Figure 3. Typical Phase Noise Plot at 161.1328 MHz
(V
DD
= 2.5 V ± 5% or V
http://onsemi.com
Every Year After 1
100 kHz of Carrier
10 MHz of Carrier
12 kHz to 20 MHz
DD
100 Hz of Carrier
10 kHz of Carrier
1 MHz of Carrier
1 kHz of Carrier
10,000 Cycles
10,000 Cycles
1000 Cycles
1000 Cycles
Conditions
= 3.3 V ± 10%, GND = 0 V, T
(Note 5)
1
4
st
Year
st
Min.
48
A
= −40°C to +85°C) (Note 4)
161.1328
−101
−126
−127
−135
−159
−119
Typ.
115
115
0.5
0.6
50
1
7
5
1
Max.
0.75
±50
200
400
400
35
20
52
8
4
5
3
1
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
Units
MHz
ppm
ppm
ppm
ms
ps
ps
ps
ps
ps
ns
ps
ps
%

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