mc33291dw/r2 Freescale Semiconductor, Inc, mc33291dw/r2 Datasheet - Page 10

• Manufacturer Part Number: mc33291dw/r2
• Description: Eight-output Switch With Serial Peripheral Interface I/o
• Manufacturer: Freescale Semiconductor, Inc

10
33291
ELECTRICAL CHARACTERISTICS
ELECTRICAL PERFORMANCE CURVES
SCLK
SO
(Low-to-High)
SO
(High-to-Low)
SO (Low-to-High) is for an output with internal conditions such that
the low-to-high transition of
high to low.
1. SO (high-to-low) waveform is for SO output with internal conditions such
2. SO (low-to-high) waveform is for SO output with internal conditions such
CS
SO
SO
(High-to-Low)
(Low-to-High)
that SO output is low except when an output is disabled as a result of de-
tecting a circuit fault with CS in a High Logic state; e.g., open load.
that SO output is high except when an output is disabled as a result of de-
tecting a circuit fault with CS in a High Logic state; e.g., shortened load.
Figure 8. Enable and Disable Time Waveforms
0.2 V DD
0.7 V
Figure 7. Valid Data Delay Time and
0.2 V
0.7 V
t
t
t
DD
DLY(LH)
VALID
DLY(HL)
t
R(SI)
DD
DD
Valid Time Waveforms
t
R (SI)
< 50 ns
< 50 ns
t SO(EN)
t SO(EN)
CS
10%
90%
t
t
R (SO)
F (SO)
90%
10%
50%
causes the SO output to switch from
t
F(SI)
0.7 V
0.2 V
90%
< 50 ns
DD
DD
0.7 V DD
t SO(DIS)
t SO(DIS)
t
F (SI)
< 50 ns
VTri-State
VTri-State
0.2 V
10%
DD
5.0 V
t
SO(DIS)
5.0 V
0
VOH
0
V
V
V
V
OH
OL
OH
OL
C
C
CS
L
L
CS
represents the total capacitance of the test fixture and probe.
represents the total capacitance of the test fixture and probe.
Figure 10. Output Fault Unlatch Disable
Figure 9. Switching Time Test Circuit
V
DD
33291
V
Under
Delay Test Circuit
33291
Test
DD
Under
= 5.0 V
Test
Analog Integrated Circuit Device Data
= 5.0 V
Freescale Semiconductor
V
V
PWR
PWR
= 14 V
= 11 V
C
(Ουτπυτ ΟΝ)
Ι L = 2.0 Α
R
C
L
L
L
= 20 pF
= 26 Ω
Output
Output