mm8202 Integrated Device Technology, mm8202 Datasheet - Page 5

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mm8202

Manufacturer Part Number
mm8202
Description
Cmos Oscillator
Manufacturer
Integrated Device Technology
Datasheet
MM8202 Preliminary Data Sheet
MM8202 REVISION C DATE, 07/21/2010
Electrical Characteristics
VDD=1.62V to 1.98V, T
Notes 1. Measured with a 50Ω to GND termination
2: Measured at 48MHz output frequency
3. The MM8202 will support continuous VDD operation from 1.62 to 3.6V. The device can be powered up with a supply voltage at any of the 3 main supply rails of 1.8V, 2.5V or 3.3V.
4. Measured over 1000 cycles per JEDEC standard 65
5. Electrical parameters are guaranteed by design and characterization over the specified ambient operating temperature range, which is established when the device is mounted in a
test socket with maintained transverse airflow greater than 500lfpm. The device will meet specifications after thermal equilibrium has been reached under these conditions.
Application Diagram
Below is a representative application diagram to evaluate the MM8202. For 50Ohm terminated measurements, a balun is necessary to
provide proper impedance matching
ElectroStaticDischa
Frequency Stability
Quiescent Current
Output HIGH level
Output Frequency
Output LOW level
Cycle-cycle Jitter
Input HIGH level
Input LOW level
Supply Current
Supply Voltage
Power-up time
Phase Noise
Period Jitter
Parameter
Duty Cycle
Rise Time
Fall Time
rge
A
=0 to 70
Symbol
o
PJ
C unless otherwise noted. Typical values are measured at VDD=1.8V, T
IDDQ
F
VDD
F
ESD
V
IDD
V
V
DC
PN
V
RT
FT
CJ
OUT
t
TOT
OH
on
RMS
OL
IH
IL
variation,aging (1st year at 35oC),shock&vibration. “R” device
Factory Programmable.Contact IDT for frequencies not listed
variation,aging (1st year at 35oC),shock&vibration. “ ” device
Output valid time after VDD meets the specified range&CE
The absolute value of max change in the periods of any 2
Active supply current, VDD=1.8V, T=35oC, no output load
20% to 80% x VDD. Output load (C
80% to 20% x VDD. Output load (C
Clock output duty cycle. Measured at VDD/2, C
Total Frequency Stability over temperature,supply
Total Frequency Stability over temperature,supply
Human Body Model, tested per JESD D22-A114
Total RMS Period Jitter (including random and
5
[1.8V]
option, over -20-85
1MHz offset from carrier
CE=LOW, output disabled
option, over 0-70
adjacent cycles
Normal Operation
deterministic)
I
I
Conditions
OH
OL
transition
CE pin
CE pin
= -1.8mA
= 1.8mA
o
C range
o
1,2
1,2,4
C range
L
L
5
3
) =4pF, NSG-option
) =4pF, NSG-option
1,2
L
A
=4pF
=35
o
C
VDD*0.7
VDD-0.3
4000
1.62
Min
-0.3
45
50
6
12,24,25,50
©2010 Integrated Device Technology, Inc.
-140
Typ
100
1.8
2.0
0.2
3.5
VDD+0.3
VDD*0.3
+400
+400
-135
Max
1.98
2.75
2.75
133
400
2.5
0.3
55
50
1
CMOS OSCILLATOR
dBc/Hz
ps
Units
MHz
ppm
ppm
mA
µA
ns
ns
µs
ps
%
RMS
V
V
V
V
V
V

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