tle4982c Infineon Technologies Corporation, tle4982c Datasheet - Page 25

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tle4982c

Manufacturer Part Number
tle4982c
Description
Programmable True Power On Hall Sensor
Manufacturer
Infineon Technologies Corporation
Datasheet
Stochastic Phase Error
The stochastic phase error includes the error due to the variation of the delay time with temperature and
the error caused by the resolution of the threshold. It can be calculated in the following way:
Jitter (Repeatability)
Figure8: Phase-Jitter
Noise
Bneff_typ
∆ϕ
∆ϕ
n
∆t
∆B
ϕ
B
d
1
σ
d
cal
AC_cal
Bn_max
3
σ
B
...
...
...
...
...
...
stochastic phase error due to the variation of the delay time over temperature in °
stochastic phase error due to the resolution of the threshold value in °
speed of the camshaft wheel in min
inverse of the magnetic slope of the edge in °/T
variation of delay time over temperature in sec
accuracy of the threshold in T
Phase-Jitter
∆ϕ
∂B
ϕ
ϕ
ϕ
ϕ
cal
d
Page 25 of 28
=
=
360
ϕ
B
The phase jitter is normally caused by the analogue
system noise. If there is an update of 1bit of the
offset-DAC due to the algorithm, what could happen
after a period of 16 teeth, then an additional step in
the phase occurs (see description of the algorithm).
This is not included in the following calculations. The
noise is transformed through the slope of the
magnetic edge into a phase error. The phase jitter is
determined by the two formulas:
60
• °
n
B
AC
-1
_
t
cal
d
ϕ
ϕ
Jitter
Jitter
_
_
typ
max
=
=
ϕ
B
ϕ
B
(
B
(
B
neff
n
_
_
max
typ
)
)

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