mx846 Clare, Inc., mx846 Datasheet - Page 2

• Manufacturer Part Number: mx846
• Description: 50 Ma Switched Capacitor Buck-boost Dc/dc Converter With Regulated Output
• Manufacturer: Clare, Inc.

MX846-02
Absolute Maximum Ratings
T
Pin Description
ESD Warning
ESD (electrostatic discharge) sensitive device. Although the MX846 features proprietary ESD protection circuitry,
permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
MX846-02
Drawing No. 017709
A
Input Voltage
Output Voltage
Power Dissipation (θ
Operating Temperature Range
Storage Temperature Range
Pin No.
= +25°C unless otherwise noted
1
2
3
4
5
6
7
8
Pin Name
Parameter
CP_FB
EN_IN
CPOS
CNEG
DVCC
DVSS
(V
CPO
NC
(V
IN
OUT
to GND)
JA
to GND)
= 114 °C/W)
Description
Positive Terminal for the Pump Capacitor, (1.0 uF).
Input Voltage. Connect a low ESR bypass capacitor between this pin and
device ground to minimize supply transients.
Negative Terminal for the Pump Capacitor, (1.0 uF).
Logic Level Enable. Apply a logic high or connect to DVCC to enable the
device. Apply a logic low or connect to ground for shutdown. In Shutdown
mode, the charge pump is turned off and quiescent current is reduced.
A resistor divider from CPO to CP_FB will set the CPO output voltage.
V
Active Low Output Status, (Open Drain). A logic low indicates that the output
voltage is at the set point level.
Ground
Regulated Output Voltage. Connect a low ESR, 4.7 µF or larger capacitor
between this pin and device ground.
CPO
= V
REF
(1 + R
Min
-40
-65
1
/R
2
Max
660
+85
150
) = 1.25 V (1 + R
+7
+7
2
Unit
mW
°C
o
V
V
C
1
/R
Absolute Maximum Ratings are stress
ratings. Stresses in excess of these ratings
can cause permanent damage to the
device. Functional operation of the device
at these or any other conditions beyond
those indicated in the operational sections
of this data sheet is not implied. Exposure
of the device to the absolute maximum
ratings for an extended period may
degrade the device and affect its reliability.
2
)
IXYS
www.claremicronix.com
4/28/08