tle5010 Infineon Technologies Corporation, tle5010 Datasheet - Page 45

• Manufacturer Part Number: tle5010
• Description: Gmr Based Angular Sensor
• Manufacturer: Infineon Technologies Corporation

Draft
11
Two different test signal structures are implemented in the TLE5010. These are:
• Functional angle test. In this case, well-knows signals feed the ADCs.
• Temperature measurement. This is useful to read out the chip temperature for
11.1
It is possible to feed the ADCs with appropriate values to simulate a certain magnet-
position and other GMR effects.
The values are generated with resistors on the chip.
Following X / Y ADC values can be programmed:
• 4 points, circle amplitude = 70.7%
• 8 points, circle amplitude = 100.0%
• 8 points, circle amplitude = 122.1%
• 4 points, circle amplitude = 141.4%
Note: The 100% values correspond to typically 21700 digits and a voltage of ~ 110 mV.
Table 17
Register Bits
000
001
010
011
100
101
110
111
1)
Preliminary Data Sheet
compensation purposes.
(0°, 90°, 180°, 270°)
(0°, 45°, 90°, 135°,180°, 225°, 270°, 315°)
(35.3°, 54.7°, 125.3°, 144.7°, 215.3°, 234.7°, 305.3°, 324.7°)
(45°, 135°, 225°, 315°)
Not allowed to use.
1)
Test Structures
Functional Angle Tests
Functional Angle Test
X / Y Values (decimal)
min.
-400
14800
20700
-400
-14800
-20700
typ.
0
15500
21700
0
-15500
-21700
45
-32768
32767
max.
400
16200
22700
400
-16200
-22700
Test Structures
V 0.9, 2007-05
TLE5010