mc9s08sc4 Freescale Semiconductor, Inc, mc9s08sc4 Datasheet - Page 24

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mc9s08sc4

Manufacturer Part Number
mc9s08sc4
Description
Mc9s08sc4 8-bit Microcontroller Data Sheet
Manufacturer
Freescale Semiconductor, Inc
Datasheet
1
Chapter 3 Electrical Characteristics
3.13
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the MCU resides. Board
design and layout, circuit topology choices, location and characteristics of external components as well as MCU software
operation all play a significant role in EMC performance. The system designer should consult Freescale applications notes such
as AN2321, AN1050, AN1263, AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC
performance.
3.13.1
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell method in accordance
with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed with the microcontroller installed on a
custom EMC evaluation board while running specialized EMC test software. The radiated emissions from the microcontroller
are measured in a TEM cell in two package orientations (North and East).
The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal to the reported
emissions levels.
24
Radiated emissions,
electric field
Data based on qualification test results.
Parameter
EMC Performance
Radiated Emissions
V
Symbol
Table 3-15. Radiated Emissions, Electric Field
RE_TEM
MC9S08SC4 MCU Series Data Sheet, Rev. 4
package type
Conditions
T
16-TSSOP
V
A
DD
= +25
= 5 V
o
C
500 – 1000 MHz
150 – 500 MHz
0.15 – 50 MHz
50 – 150 MHz
Frequency
SAE Level
IEC Level
4 MHz crystal
8 MHz bus
f
OSC
/f
BUS
Freescale Semiconductor
Level
(Max)
–11
–11
–10
–7
N
1
1
dBμV
Unit

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