msm98s000 ETC-unknow, msm98s000 Datasheet - Page 14

• Manufacturer Part Number: msm98s000
• Description: 0.8m Mixed 3-v/5-v Gates Customer Structured Arrays
• Manufacturer: ETC-unknow

AUTOMATIC TEST VECTOR GENERATION
OKI’s 0.8 m ASIC technologies support Automatic Test Vector Generation (ATVG) using full scan-path
design techniques, including the following:
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• Increases fault coverage 95%
• Uses Synopsys Test Compiler
• Automatically inserts scan structures
• Connects scan chains
• Traces and reports scan chains
• Checks for rule violations
• Generates complete fault reports
• Allows multiple scan chains
• Supports vector compaction
MSM38S/98S Data Sheet
OKI SEMICONDUCTOR
Scan Data In
Scan Select
––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––
Figure 7. Full Scan Path Configuration
D
SD
SS
C
FD1AS
QN
Q
Combinational Logic
A
B
D
SD
SS
C
FD1AS
QN
Q
Scan Data Out