k4s510432m Samsung Semiconductor, Inc., k4s510432m Datasheet - Page 5

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k4s510432m

Manufacturer Part Number
k4s510432m
Description
512mbit Sdram 4bit Banks Synchronous Dram Lvttl
Manufacturer
Samsung Semiconductor, Inc.
Datasheet
ABSOLUTE MAXIMUM RATINGS
K4S510432M
Note :
DC OPERATING CONDITIONS
(Recommended operating conditions (Voltage referenced to V
Notes :
CAPACITANCE
Notes :
Voltage on any pin relative to Vss
Voltage on V
Storage temperature
Power dissipation
Short circuit current
Clock
RAS, CAS, WE, CS, CKE
DQM
Address
DQ
Supply voltage
Input logic high voltage
Input logic low voltage
Output logic high voltage
Output logic low voltage
Input leakage current
0
~ DQ
Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
1. -75 only specify a maximum value of 3.5pF
2. -75 only specify a maximum value of 3.8pF
3. -75 only specify a maximum value of 6.0pF
1. V
2. V
3. Any input 0V
Parameter
3
Input leakage currents include Hi-Z output leakage for all bi-directional buffers with Tri-State outputs.
IH
IL
DD
(min) = -2.0V AC. The undershoot voltage duration is
Parameter
(max) = 5.6V AC.The overshoot voltage duration is
supply relative to Vss
Pin
(V
DD
V
IN
= 3.3V, T
V
DDQ
V
Symbol
DD
.
V
V
V
A
V
, V
I
OH
OL
LI
IH
IL
= 23 C, f = 1MHz, V
DDQ
V
V
Symbol
Min
-0.3
Symbol
3.0
2.0
2.4
-10
DD
IN
C
C
C
C
-
T
C
DQM
, V
I
ADD
OUT
CLK
, V
P
STG
OS
IN
D
OUT
DDQ
REF
SS
= 0V, T
= 1.4V
3ns.
3ns.
Typ
3.3
3.0
A
0
-
-
-
= 0 to 70 C)
200 mV)
Min
2.5
2.5
2.5
2.5
4.0
V
DD
Max
3.6
0.8
0.4
-55 ~ +150
10
-1.0 ~ 4.6
-1.0 ~ 4.6
-
+0.3
Value
50
1
Max
4.0
5.0
5.0
5.0
6.5
Unit
uA
V
V
V
V
V
Rev. 0.2 Dec. 2001
CMOS SDRAM
Preliminary
I
OH
I
OL
Unit
mA
W
Note
V
V
Unit
C
= -2mA
= 2mA
pF
pF
pF
pF
pF
1
2
3

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