k4h1g0738b Samsung Semiconductor, Inc., k4h1g0738b Datasheet

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k4h1g0738b

Manufacturer Part Number
k4h1g0738b
Description
Stacked 1gb B-die Ddr Sdram Specification
Manufacturer
Samsung Semiconductor, Inc.
Datasheet
DDR SDRAM stacked 1Gb B-die (x4/x8)
Stacked 1Gb B-die DDR SDRAM Specification
INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS,
AND IS SUBJECT TO CHANGE WITHOUT NOTICE.
NOTHING IN THIS DOCUMENT SHALL BE CONSTRUED AS GRANTING ANY LICENSE,
EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE,
TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOLOGY. ALL
INFORMATION IN THIS DOCUMENT IS PROVIDED
ON AS "AS IS" BASIS WITHOUT GUARANTEE OR WARRANTY OF ANY KIND.
1. For updates or additional information about Samsung products, contact your nearest Samsung office.
2. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar
applications where Product failure could result in loss of life or personal or physical harm, or any military or
defense application, or any governmental procurement to which special terms or provisions may apply.
* Samsung Electronics reserves the right to change products or specification without notice.
66 TSOP-II
(x4/x8)
Rev. 1.5 June. 2005
DDR SDRAM

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k4h1g0738b Summary of contents

Page 1

... DDR SDRAM stacked 1Gb B-die (x4/x8) Stacked 1Gb B-die DDR SDRAM Specification INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS, AND IS SUBJECT TO CHANGE WITHOUT NOTICE. NOTHING IN THIS DOCUMENT SHALL BE CONSTRUED AS GRANTING ANY LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOLOGY. ALL INFORMATION IN THIS DOCUMENT IS PROVIDED ON AS " ...

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... Absolute Maximum Rating .....................................................................................................10 11.0 DC Operating Conditions ........................................................................................................10 12.0 DDR SDRAM Spec Items & Test Conditions .........................................................................11 13.0 Input/Output Capacitance ......................................................................................................11 14.0 Detailed test condition for DDR SDRAM IDD1 & IDD7A ......................................................12 15.0 DDR SDRAM IDD spec table ..................................................................................................13 16.0 AC Operating Conditions .......................................................................................................14 17.0 AC Overshoot/Undershoot specification for Address and Control Pins ...........................14 18.0 Overshoot/Undershoot specification for Data, Strobe and Mask Pins...............................15 19.0 AC Timming Parameters & ...

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... DDR SDRAM stacked 1Gb B-die (x4/x8) Revision History Revision Month Year 0.0 May 2003 1.0 June 2003 1.1 August 2003 1.2 January 2004 1.3 May 2004 1.4 October 2004 1.5 June 2005 - First version for internal review - Deleted "B3" speed. - Corrected typo. - Corrected typo. - Modified IDD current spec. ...

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... TSOP II (Leaded & Pb-Free(RoHS compliant)) 2.0 Ordering Information Part No. K4H1G0638B-T(U)C/LA2 K4H1G0638B-T(U)C/LB0 K4H1G0738B-T(U)C/LA2 K4H1G0738B-T(U)C/LB0 Note : Leaded and Lead-free(Pb-free) can be discriminated by PKG P TSOP with Leaded TSOP with Lead-free) 3.0 Operating Frequencies Speed @CL2 Speed @CL2.5 Speed @CL3 CL-tRCD-tRP package Org ...

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... DDR SDRAM stacked 1Gb B-die (x4/x8) 4.0 Pin Description DDQ SSQ DDQ SSQ DDQ CAS RAS CS0 CS1 AP/A AP Organization st.256Mx4 st.128Mx8 DM is internally loaded to match DQ and DQS identically. ...

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... DDR SDRAM stacked 1Gb B-die (x4/x8) 5.0 Package Physical Dimension #66 #1 0.65 NOTE REFERENCE ASS’Y OUT QUALITY 6.0 Block Diagram CK,CK,CAS RAS,WE,DM 128Mx4 CKE1,CS1 128Mx4 CKE0,CS0 I/O0-I/O3,DQS st.256Mb x 4 #34 #33 22.62MAX 22.22 ± 0.10 0.25 (0.71) ± 0.08 66pin TSOPII / Package dimension CK,CK,CAS RAS,WE,DM CKE1,CS1 CKE0,CS0 A0-A12,BA0,BA1 ...

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... DDR SDRAM stacked 1Gb B-die (x4/x8) 7.0 Input/Output Function Description SYMBOL TYPE CK, CK Input CKE Input CS Input RAS, CAS, WE Input LDM,(UDM) Input BA0, BA1 Input 12] Input DQ I/O LDQS,(U)DQS I VDDQ Supply VSSQ Supply VDD Supply VSS Supply VREF Input Clock : CK and CK are differential clock inputs. All address and control input signals are sam- pled on the positive edge of CK and negative edge of CK ...

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... DM(x4/8) sampled at the rising and falling edges of the DQS and Data-in are masked at the both edges (Write DM latency is 0). UDM/LDM(x16 only) sampled at the rising and falling edges of the UDQS/LDQS and Data-in are masked at the both edges (Write UDM/LDM latency is 0). 9. This combination is not defined for any function, which means "No Operation(NOP)" in DDR SDRAM. CKEn-1 CKEn CS ...

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... Banks / st. 32M x 8Bit x 4 Banks Double Data Rate SDRAM 9.0 General Description The K4H1G0638B / K4H1G0738B is 1,073,741,824 bits of double data rate synchronous DRAM organized as 4x 67,108,864 / 4x 33,554,432 / 4x 8,388,608 words by 4/ 8bits, fabricated with SAMSUNG′s high performance CMOS technology. Synchronous features with Data Strobe allow extremely high performance up to 266Mb/s per pin ...

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... DDR SDRAM stacked 1Gb B-die (x4/x8) 12.0 DDR SDRAM Spec Items & Test Conditions Operating current - One bank Active-Precharge; tRC=tRCmin; tCK=10ns for DDR200, tCK=7.5ns for DDR266, 6ns for DDR333, 5ns for DDR400; DQ,DM and DQS inputs changing once per clock cycle; address and control inputs changing once every two clock cycles. ...

Page 11

... DDR SDRAM stacked 1Gb B-die (x4/x8) 14.0 Detailed test condition for DDR SDRAM IDD1 & IDD7A IDD1 : Operating current: One bank operation 1. Typical Case: Fro DDR200,266,333: Vdd = 2.5V, T=25’C; For DDR400: Vdd=2.6V,T=25’C Worst Case : Vdd = 2.7V, T= 10’c 2. Only one bank is accessed with tRC(min), Burst Mode, Address and Control inputs on NOP edge are changing once per clock cycle ...

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... IDD3P IDD3N IDD4R IDD4W IDD5 Normal IDD6 Low power IDD7A st.256Mx4 (K4H1G0638B) 140 165 200 205 270 10 6 390 st.128Mx8 (K4H1G0738B) 140 165 200 205 270 10 6 390 DDR SDRAM (V =2.7V 10°C) DD Unit Notes B0(DDR266@CL=2.5) 140 mA 165 ...

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... DDR SDRAM stacked 1Gb B-die (x4/x8) 16.0 AC Operating Conditions Parameter/Condition Input High (Logic 1) Voltage, DQ, DQS and DM signals Input Low (Logic 0) Voltage, DQ, DQS and DM signals. Input Differential Voltage, CK and /CK inputs Input Crossing Point Voltage, CK and /CK inputs Note : 1. VID is the magnitude of the difference between the input level on CK and the input level on /CK. ...

Page 14

... DDR SDRAM stacked 1Gb B-die (x4/x8) 18.0 Overshoot/Undershoot specification for Data, Strobe and Mask Pins Maximum peak amplitude allowed for overshoot Maximum peak amplitude allowed for undershoot The area between the overshoot signal and VDD must be less than or equal to The area between the undershoot signal and GND must be less than or equal to ...

Page 15

... DDR SDRAM stacked 1Gb B-die (x4/x8) 19.0 AC Timming Parameters & Specifications Parameter Row cycle time Refresh row cycle time Row active time RAS to CAS delay Row precharge time Row active to Row active delay Write recovery time Last data in to Read command CL=2.0 Clock cycle time CL=2 ...

Page 16

... DDR SDRAM stacked 1Gb B-die (x4/x8) 20.0 System Characteristics for DDR SDRAM The following specification parameters are required in systems using DDR333, DDR266 & DDR200 devices to ensure proper system performance. these characteristics are for system simulation purposes and are guaranteed by design. Table 1 : Input Slew Rate for DQ, DQS, and DM ...

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... DQS will be tran sitioning from High logic LOW previous write was in progress, DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on tDQSS. 14. A maximum of eight AUTO REFRESH commands can be posted to any given DDR SDRAM device. 15. For command/address input slew rate ≥ 1.0 V/ns 16. For command/address input slew rate ≥ ...

Page 18

... DDR SDRAM stacked 1Gb B-die (x4/x8) Component Notes 17. For CK & CK slew rate ≥ 1.0 V/ns 18. These parameters guarantee device timing, but they are not necessarily tested on each device. They may be guaranteed by device design or tester correlation. 19. Slew Rate is measured between VOH(ac) and VOL(ac). 20. Min (tCL, tCH) refers to the smaller of the actual clock low time and the actual clock high time as provided to the device (i.e. this value can be greater than the minimum specification limits for tCL and tCH) ...

Page 19

... DDR SDRAM stacked 1Gb B-die (x4/x8) 22.0 System Notes a. Pullup slew rate is characteristized under the test conditions as shown in Figure 2. Output Figure 2 : Pullup slew rate test load b. Pulldown slew rate is measured under the test conditions shown in Figure 3. Output Figure 3 : Pulldown slew rate test load c ...

Page 20

... DDR SDRAM Output Driver V-I Characteristics DDR SDRAM Output driver characteristics are defined for full and half strength operation as selected by the EMRS bit A1. Figures 3 and 4 show the driver characteristics graphically, and tables 8 and 9 show the same data in tabular format suitable for input into simulation tools ...

Page 21

... DDR SDRAM stacked 1Gb B-die (x4/x8) Pulldown Current (mA) Typical Typical Voltage (V) Low High 0.1 6.0 6.8 0.2 12.2 13.5 0.3 18.1 20.1 0.4 24.1 26.6 0.5 29.8 33.0 0.6 34.6 39.1 0.7 39.4 44.2 0.8 43.7 49.8 0.9 47.5 55.2 1.0 51.3 60.3 1.1 54.1 65.2 1.2 56.2 69.9 1.3 57.9 74.2 1.4 59.3 78.4 1.5 60.1 82.3 1.6 60.5 85.9 1.7 61.0 89.1 1.8 61.5 92.2 1.9 62.0 95.3 2.0 62.5 97.2 2.1 62.9 99.1 2.2 63.3 100.9 2.3 63.8 101.9 2.4 64.1 102.8 2.5 64.6 103.8 2.6 64.8 104.6 2.7 65.0 105.4 Minimum Maximum 4.6 9.6 9.2 18.2 13.8 26.0 18.4 33.9 23.0 41.8 27.7 49.4 32.2 56.8 36.8 63.2 39.6 69.9 42.6 76.3 44.8 82.5 46.2 88.3 47.1 93.8 47.4 99.1 47.7 103.8 48.0 108.4 48.4 112.1 48.9 115.9 49.1 119.6 49.4 123.3 49.6 126.5 49.8 129.5 49.9 132.4 50.0 135.0 50.2 137.3 50.4 139.2 50.5 140.8 Table 8. Full Strength Driver Characteristics DDR SDRAM pullup Current (mA) ...

Page 22

... DDR SDRAM stacked 1Gb B-die (x4/x8 0.0 Pullup Characteristics for Weak Output Driver 0.0 0 -10 -20 -30 -40 -50 -60 -70 -80 -90 Pulldown Characteristics for Weak Output Driver Figure 4. I/V characteristics for input/output buffers:Pull up(above) and pull down(below) 1.0 2.0 1.0 2.0 DDR SDRAM Maximum Typical High ...

Page 23

... DDR SDRAM stacked 1Gb B-die (x4/x8) Pulldown Current (mA) Typical Typical Voltage (V) Low High 0.1 3.4 3.8 0.2 6.9 7.6 0.3 10.3 11.4 0.4 13.6 15.1 0.5 16.9 18.7 0.6 19.6 22.1 0.7 22.3 25.0 0.8 24.7 28.2 0.9 26.9 31.3 1.0 29.0 34.1 1.1 30.6 36.9 1.2 31.8 39.5 1.3 32.8 42.0 1.4 33.5 44.4 1.5 34.0 46.6 1.6 34.3 48.6 1.7 34.5 50.5 1.8 34.8 52.2 1.9 35.1 53.9 2.0 35.4 55.0 2.1 35.6 56.1 2.2 35.8 57.1 2.3 36.1 57.7 2.4 36.3 58.2 2.5 36.5 58.7 2.6 36.7 59.2 2.7 36.8 59.6 Minimum Maximum 2.6 5.0 5.2 9.9 7.8 14.6 10.4 19.2 13.0 23.6 15.7 28.0 18.2 32.2 20.8 35.8 22.4 39.5 24.1 43.2 25.4 46.7 26.2 50.0 26.6 53.1 26.8 56.1 27.0 58.7 27.2 61.4 27.4 63.5 27.7 65.6 27.8 67.7 28.0 69.8 28.1 71.6 28.2 73.3 28.3 74.9 28.3 76.4 28.4 77.7 28.5 78.8 28.6 79.7 Table 9. Weak Driver Characteristics DDR SDRAM pullup Current (mA) Typical Typical Minimum Low High -3.5 -4.3 -2.6 -6.9 -8.2 -5.2 -10.3 -12.0 -7.8 -13.6 -15.7 -10.4 -16.9 -19.3 -13.0 -19.4 -22.9 -15.7 -21.5 -26.5 -18.2 -23.3 -30.1 -20.4 -24.8 -33.6 -21.6 -26.0 -37.1 -21.9 -27.1 -40.3 -22.1 -27.8 -43.1 -22.2 -28.3 -45.8 -22.3 -28.6 -48.4 -22.4 -28.7 -50.7 -22.6 -28.9 -52.9 -22.7 -28.9 -55.0 -22.7 -29.0 -56.8 -22.8 -29.2 -58.7 -22.9 -29.2 -60.0 -22.9 -29.3 -61.2 -23.0 -29.5 -62.4 -23.0 -29.5 -63.1 -23.1 -29.6 -63.8 -23.2 -29.7 -64.4 -23.2 -29.8 -65.1 -23.3 -29.9 -65.8 -23.3 Rev. 1.5 June. 2005 Maximum -5.0 -9.9 -14.6 -19.2 -23.6 -28.0 -32.2 -35.8 -39.5 -43.2 -46.7 -50.0 -53.1 -56.1 -58.7 -61.4 -63.5 -65.6 -67.7 -69.8 -71.6 -73.3 -74.9 -76.4 -77.7 -78.8 -79.7 ...

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