k4h280438f-tc Samsung Semiconductor, Inc., k4h280438f-tc Datasheet

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k4h280438f-tc

Manufacturer Part Number
k4h280438f-tc
Description
128mb F-die Ddr Sdram Specification
Manufacturer
Samsung Semiconductor, Inc.
Datasheet
DDR SDRAM 128Mb F-die (x4, x8)
DDR SDRAM
128Mb F-die DDR SDRAM Specification
Revision 1.1
May 2004
Rev. 1.1 May. 2004

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k4h280438f-tc Summary of contents

Page 1

... DDR SDRAM 128Mb F-die (x4, x8) 128Mb F-die DDR SDRAM Specification Revision 1.1 May 2004 DDR SDRAM Rev. 1.1 May. 2004 ...

Page 2

... DDR SDRAM 128Mb F-die (x4, x8) 128Mb F-die Revision History Revision 0.0 (January, 2004) - Target spec. release Revision 0.1 (February, 2004) - Modified DC current spec. Revision 1.0 (March, 2004) - Revision 1.0 spec. release. Revision 1.1 (May, 2004) - Corrected typo. DDR SDRAM Rev. 1.1 May. 2004 ...

Page 3

... Maximum burst refresh cycle : 8 • 66pin TSOP II package Ordering Information Part No. K4H280438F-TC/LA2 K4H280438F-TC/LB0 32M x 4 K4H280438F-TC/LA0 K4H280838F-TC/LB3 K4H280838F-TC/LA2 16M x 8 K4H280838F-TC/LB0 Operating Frequencies B3(DDR333@CL=2.5) Speed @CL2 Speed @CL2.5 *CL : CAS Latency Org ...

Page 4

... DDR SDRAM 128Mb F-die (x4, x8) Pin Description DDQ DDQ SSQ SSQ DDQ DDQ SSQ SSQ DDQ DDQ ...

Page 5

... DDR SDRAM 128Mb F-die (x4, x8) Package Physical Dimension #66 #1 (1.50) (0.71) NOTE REFERENCE ASS’Y OUT QUALITY #34 #33 22.22±0.10 (10×) 0.65TYP 0.30±0.08 0.65±0.08 (10×) 66pin TSOPII / Package dimension DDR SDRAM Units : Millimeters (10×) (10×) +0.075 0.125 -0.035 0.10 MAX 0.25TYP [ ] 0.075 MAX 0× ...

Page 6

... DDR SDRAM 128Mb F-die (x4, x8) / Block Diagram (8Mbit x 4 4Mbit Banks) Bank Select CK, CK ADD LCKE LRAS LCBR LWE CK, CK CKE CS 4/8 CK, CK Data Input Register Serial to parallel 8/16 4Mx8/ 2Mx16 4Mx8/ 2Mx16 4Mx8/ 2Mx16 4Mx8/ 2Mx16 Column Decoder Latency & Burst Length ...

Page 7

... DDR SDRAM 128Mb F-die (x4, x8) Input/Output Function Description SYMBOL TYPE Clock : CK and CK are differential clock inputs. All address and control input signals are sam- CK, CK Input pled on the positive edge of CK and negative edge of CK. Output (read) data is referenced to both edges of CK. Internal clock signals are derived from CK/CK. ...

Page 8

... DM(x4/8) sampled at the rising and falling edges of the DQS and Data-in are masked at the both edges (Write DM latency is 0). UDM/LDM(x16 only) sampled at the rising and falling edges of the UDQS/LDQS and Data-in are masked at the both edges (Write UDM/LDM latency is 0). 9. This combination is not defined for any function, which means "No Operation(NOP)" in DDR SDRAM. CKEn-1 CKEn CS ...

Page 9

... Banks / 4M x 8Bit x 4 Banks Double Data Rate SDRAM General Description The K4H280438F / K4H280838F is 134,217,728 bits of double data rate synchronous DRAM organized as 4x 8,388,608 / 4x 4,194,304 words by 4/ 8bits, fabricated with SAMSUNGcs high performance CMOS technology. Synchronous features with Data Strobe allow extremely high performance up to 333Mb/s per pin ...

Page 10

... DDR SDRAM 128Mb F-die (x4, x8) DDR SDRAM Spec Items & Test Conditions Operating current - One bank Active-Precharge; tRC=tRCmin; tCK=7.5ns for DDR266, 6ns for DDR333; DQ,DM and DQS inputs changing once per clock cycle; address and control inputs changing once every two clock cycles. ...

Page 11

... IDD0 85 IDD1 110 IDD2P 3 IDD2F 22 IDD2Q 20 IDD3P 25 IDD3N 40 IDD4R 140 IDD4W 145 IDD5 165 Normal 2 IDD6 Low power 1 IDD7A 300 32Mx4 (K4H280438F) B0(DDR266@CL=2.5) A0(DDR200@CL=2.0) 80 105 105 120 150 2 1 280 16Mx8 (K4H280838F) A2(DDR266@CL=2.0) B0(DDR266@CL=2.5) 85 110 120 125 ...

Page 12

... DDR SDRAM 128Mb F-die (x4, x8) < Detailed test conditions for DDR SDRAM IDD1 & IDD7A > IDD1 : Operating current: One bank operation 1. Only one bank is accessed with tRC(min), Burst Mode, Address and Control inputs on NOP edge are changing once per clock cycle. lout = 0mA 2 ...

Page 13

... DDR SDRAM 128Mb F-die (x4, x8) AC Operating Conditions Parameter/Condition Input High (Logic 1) Voltage, DQ, DQS and DM signals Input Low (Logic 0) Voltage, DQ, DQS and DM signals. Input Differential Voltage, CK and /CK inputs Input Crossing Point Voltage, CK and /CK inputs Notes : 1. VID is the magnitude of the difference between the input level on CK and the input level on /CK. ...

Page 14

... DDR SDRAM 128Mb F-die (x4, x8) Overshoot/Undershoot specification for Data, Strobe, and Mask Pins Maximum peak amplitude allowed for overshoot Maximum peak amplitude allowed for undershoot The area between the overshoot signal and VDD must be less than or equal to The area between the undershoot signal and GND must be less than or equal to ...

Page 15

... DDR SDRAM 128Mb F-die (x4, x8) AC Timming Parameters & Specifications Parameter Row cycle time Refresh row cycle time Row active time RAS to CAS delay Row precharge time Row active to Row active delay Write recovery time Last data in to Read command Col. address to Col. address delay CL=2 ...

Page 16

... DDR SDRAM 128Mb F-die (x4, x8) Parameter Symbol Output DQS valid window tQH Clock half period tHP Data hold skew factor tQHS DQS write postamble time tWPST Active to Read with Auto precharge tRAP command Autoprecharge write recovery + Precharge time tDAL AC Operating Test Conditions (V =2 ...

Page 17

... DDR SDRAM 128Mb F-die (x4, x8) System Characteristics for DDR SDRAM The following specification parameters are required in systems using DDR333, DDR266 devices to ensure proper system performance. these characteristics are for system simulation purposes and are guaranteed by design. Table 1 : Input Slew Rate for DQ, DQS, and DM ...

Page 18

... DQS will be tran sitioning from High logic LOW previous write was in progress, DQS could be HIGH, LOW, or transitioning from HIGH to LOW at this time, depending on tDQSS maximum of eight AUTO REFRESH commands can be posted to any given DDR SDRAM device. 5. For command/address input slew rate t1.0 V/ns 6. For command/address input slew rate t0.5 V/ns and 1.0 V/ns 7. For CK & ...

Page 19

... DDR SDRAM 128Mb F-die (x4, x8) b. Pulldown slew rate is measured under the test conditions shown in Figure 2. Output Figure 2 : Pulldown slew rate test load c. Pullup slew rate is measured between (VDDQ/2 - 320 mV +/- 250 mV) Pulldown slew rate is measured between (VDDQ/2 + 320 mV +/- 250 mV) Pullup and Pulldown slew rate conditions are to be met for any pattern of data, including all outputs switching and only one output switching ...

Page 20

... DDR SDRAM Output Driver V-I Characteristics DDR SDRAM Output driver characteristics are defined for full and half strength operation as selected by the EMRS bit A1. Figures 3 and 4 show the driver characteristics graphically, and tables 8 and 9 show the same data in tabular format suitable for input into simulation tools ...

Page 21

... DDR SDRAM 128Mb F-die (x4, x8) Pulldown Current (mA) Typical Typical Voltage (V) Low High 0.1 6.0 6.8 0.2 12.2 13.5 0.3 18.1 20.1 0.4 24.1 26.6 0.5 29.8 33.0 0.6 34.6 39.1 0.7 39.4 44.2 0.8 43.7 49.8 0.9 47.5 55.2 1.0 51.3 60.3 1.1 54.1 65.2 1.2 56.2 69.9 1.3 57.9 74.2 1.4 59.3 78.4 1.5 60.1 82.3 1.6 60.5 85.9 1.7 61.0 89.1 1.8 61.5 92.2 1.9 62.0 95.3 2.0 62.5 97.2 2.1 62.9 99.1 2.2 63.3 100.9 2.3 63.8 101.9 2.4 64.1 102.8 2.5 64.6 103.8 2.6 64.8 104.6 2.7 65.0 105.4 Table 8. Full Strength Driver Characteristics Typical Minimum Maximum Low 4.6 9.6 -6.1 9.2 18.2 -12.2 13.8 26.0 -18.1 18.4 33.9 -24.0 23.0 41.8 -29.8 27.7 49.4 -34.3 32.2 56.8 -38.1 36.8 63.2 -41.1 39.6 69.9 -41.8 42.6 76.3 -46.0 44.8 82.5 -47.8 46.2 88.3 -49.2 47.1 93.8 -50.0 47.4 99.1 -50.5 47.7 103.8 -50.7 48.0 108.4 -51.0 48.4 112.1 -51.1 48.9 115.9 -51.3 49.1 119.6 -51.5 49.4 123.3 -51.6 49.6 126.5 -51.8 49.8 129.5 -52.0 49.9 132.4 -52.2 50.0 135.0 -52.3 50.2 137.3 -52.5 50.4 139.2 -52.7 50.5 140.8 -52.8 DDR SDRAM ...

Page 22

... DDR SDRAM 128Mb F-die (x4, x8 0.0 Pullup Characteristics for Weak Output Driver 0.0 0 -10 -20 -30 -40 -50 -60 -70 -80 -90 Pulldown Characteristics for Weak Output Driver Figure 4. I/V characteristics for input/output buffers:Pull up(above) and pull down(below) 1.0 2.0 1.0 2.0 DDR SDRAM Maximum Typical High ...

Page 23

... DDR SDRAM 128Mb F-die (x4, x8) Pulldown Current (mA) Typical Typical Voltage (V) Low High 0.1 3.4 3.8 0.2 6.9 7.6 0.3 10.3 11.4 0.4 13.6 15.1 0.5 16.9 18.7 0.6 19.6 22.1 0.7 22.3 25.0 0.8 24.7 28.2 0.9 26.9 31.3 1.0 29.0 34.1 1.1 30.6 36.9 1.2 31.8 39.5 1.3 32.8 42.0 1.4 33.5 44.4 1.5 34.0 46.6 1.6 34.3 48.6 1.7 34.5 50.5 1.8 34.8 52.2 1.9 35.1 53.9 2.0 35.4 55.0 2.1 35.6 56.1 2.2 35.8 57.1 2.3 36.1 57.7 2.4 36.3 58.2 2.5 36.5 58.7 2.6 36.7 59.2 2.7 36.8 59.6 Table 9. Weak Driver Characteristics Typical Minimum Maximum Low 2.6 5.0 -3.5 5.2 9.9 -6.9 7.8 14.6 -10.3 10.4 19.2 -13.6 13.0 23.6 -16.9 15.7 28.0 -19.4 18.2 32.2 -21.5 20.8 35.8 -23.3 22.4 39.5 -24.8 24.1 43.2 -26.0 25.4 46.7 -27.1 26.2 50.0 -27.8 26.6 53.1 -28.3 26.8 56.1 -28.6 27.0 58.7 -28.7 27.2 61.4 -28.9 27.4 63.5 -28.9 27.7 65.6 -29.0 27.8 67.7 -29.2 28.0 69.8 -29.2 28.1 71.6 -29.3 28.2 73.3 -29.5 28.3 74.9 -29.5 28.3 76.4 -29.6 28.4 77.7 -29.7 28.5 78.8 -29.8 28.6 79.7 -29.9 DDR SDRAM pullup Current (mA) Typical Minimum Maximum High -4.3 -2.6 -5.0 -8.2 -5.2 -9.9 -12.0 -7.8 -14.6 -15.7 -10.4 -19.2 -19.3 -13.0 -23.6 -22.9 -15.7 -28.0 -26.5 -18.2 -32.2 -30.1 -20.4 -35.8 -33.6 -21.6 -39.5 -37.1 -21.9 -43.2 -40.3 -22.1 -46.7 -43.1 -22.2 -50.0 -45.8 -22.3 -53.1 -48.4 -22.4 -56.1 -50.7 -22.6 -58.7 -52.9 -22.7 -61.4 -55.0 -22.7 -63.5 -56.8 -22.8 -65.6 -58.7 -22.9 -67.7 -60.0 -22.9 -69.8 -61.2 -23.0 -71.6 -62.4 -23.0 -73.3 -63.1 -23.1 -74.9 -63.8 -23.2 -76.4 -64.4 -23.2 -77.7 -65.1 -23.3 -78.8 -65.8 -23.3 -79.7 Rev. 1.1 May. 2004 ...

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