CS2012C0G104B100NBA SAMWHA [SAMWHA ELECTRIC], CS2012C0G104B100NBA Datasheet - Page 10

• Manufacturer Part Number: CS2012C0G104B100NBA
• Description: Multi Layer Ceramic Capacitors
• Manufacturer: SAMWHA [SAMWHA ELECTRIC]

No.
10
8
9
22
Temperature Appearance
Cycle
Humidity
Load
High
Temperature
Load
SAMWHA CAPACITOR Co., Ltd.
Item
Capacitance Within ±2.5% or ±0.25㎊ X7R, X5R : Within ±7.5%
Change
Dissipation
Factor
(or Q)
I.R.
Appearance
Capacitance Within ±7.5% or ±0.75㎊ X7R, X5R : Within ±12.5%
Change
I.R.
Appearance
Capacitance
Change
Dissipation
Factor
(or Q)
I.R.
Dissipation
Factor
(or Q)
Compensating Type
30㎊ Min. :
Q≥350 (DF≤0.3%)
10㎊≤Cp ≤30㎊ :
Q≥275 +5/2C
(DF≤1/(275+5/2C))
10㎊ Max. :
Q≥200+10C
(DF≤1/(200+10C))
No marking defects
(whichever is larger) Y5V
More than 10,000
No marking defects
(whichever is larger) Y5V
30㎊ Min. :
Q≥200 (DF≤0.5%)
30㎊ Max. :
Q≥100 +10/3C
(DF≤1/(100+10/3C))
More than 500
No marking defects
Within ±3% or ±0.3㎊
(whichever is larger) Y5V
More than 10,000
30㎊ Min. :
Q≥1,000 (DF≤0.1%)
30㎊ Max. :
Q≥400+20C
(DF≤1/(400+20C))
Temperature
MΩ
MΩ
MΩ
or 25
or 500
or 50
Characteristic
Ω .F
X7R, X5R : Within ±12.5%
Char. 50V Min. 25V
Char. 50V Min. 25V
Char. 50V Min. 25V
X7R ≤5%/ ≤5%/
X5R
Y5V
X7R ≤5%/ ≤5%/
X5R
Y5V
X7R ≤5%/ ≤5%/ ≤5%/ ≤7.5%/ ≤7.5%/
X5R
Y5V
Ω .F
Ω .F
High Dielectric Constant Type
(Whichever is smaller)
≤7.5%/ ≤10%/ ≤12.5% ≤15%/
≤7.5%/ ≤10%/ ≤12.5% ≤15%/
≤7.5%/ ≤10%/ ≤12.5% ≤15%/
≤7.5% ≤10%
≤7.5% ≤10%
≤12.5% ≤12.5%
≤7.5% ≤10% ≤10% ≤12.5% ≤12.5%
≤12.5% ≤12.5%
≤12.5% ≤12.5%
(Whichever is smaller)
(Whichever & Smaller)
: Within ±20%
: Within +30%, -40%
: Within ±30%(Cap. < 1.0㎌)
(Y5V/1.0㎌, 2.2㎌, 4.7㎌/10V)
Within ±30% (others)
Within +30%, -40%
(Cap. ≥ 1.0㎌)
≤5%/ ≤7.5%/ ≤7.5%/
≤5%/ ≤7.5%/ ≤7.5%/
16V
≤10% ≤12.5% ≤12.5%
16V
≤10% ≤12.5% ≤12.5%
16V
≤15%
≤15%
≤15%
10V
≤20%
10V
≤20%
10V
≤20%
≤20%
≤20%
≤20%
6.3V
6.3V
6.3V
Temp. Operating Room Operating Room
Time
(Min)
- Initial measurement
- Measurement after test
- Temperature : 40±2℃
- Humidity : 90~95%
- Hour : 500±12hrs
- Test Voltage : The rated voltage
- Take it out and set it for 24±2 hours
- Testing time : 1000±12hrs
- Applied voltage :
- Temperature :
- Measurement after test
Perform the five cycless according
to the four heat treatments listed in
the following table.
Step
(temperature compensating) or
(℃)
48±4 hours(high dielectric constant
type) at room temperature, then
measure.
less than 50mA
Perform a heat treatment at 150+0,
-10℃ for one hour and then let sit
for 48±4 hours at room temperature.
Take it out and set it for 24±2 hours
(temperature compensating) or
48±4 hours(high dielectric constant
type) at room temperature, then
measure.
The charge/discharge current is
C0G, X7R → 125±3℃
Take it out and set it for 24±2
Rated voltage < DC250V : ×200%
X5R , Y5V → 85±3℃
hours(temperature compensating
type)or 48±4 hours (high dielectric
constant type) at room temperature,
then measure.
The charge/discharge current is
less than 50mA.
Temp.
+0, -3
30±3
Min.
and Conditions
1
Test Methods
Temp.
2 to 3
2
Temp.
+3, -0
30±3
Max.
3
Temp.
2 to 3
4
No.
11 Bending
12
13 Humidity
Strength
Vibration
Resistance
Steady
State
Item
Capacitance Within ±5% or ±0.5㎊
Change
Appearance No defects or abnormalities
Capacitance Whin the specified tolerance
Q/DF
Appearance No marking defects
Capacitance Within ±5% or ±0.5㎊
Change
Dissipation
(or Q)
I.R
(whichever is larger)
(whichever is larger)
30㎊ Min. :
Q 1,000 (DF 0.1%)
30㎊ Max. :
Q 400+20C
(DF 1/ (400+20C))
Compensating Type
More than 1,000
30㎊ Min. :
Q≥350 (DF≤0.3%)
10㎊≤Cp ≤30㎊ :
Q≥275 +5/2C
(DF≤1/(275+5/2C))
10㎊ Max. :
Q≥200+10C
(DF≤1/(200+10C))
Temperature
No cracking or marking defects shall occur
MΩ
or 50
Characteristic
Char. 50V Min. 25V
Char. 50V Min. 25V
X7R ≤2.5%/ ≤3%/ ≤3.5%/ ≤5%/ ≤5%/
X5R
Y5V
X7R ≤5%/ ≤5%/
X5R
Y5V
Ω .F
X7R, X5R : Within ±12.5%
Y5V
X7R, X5R : Within ±12.5%
Y5V
High Dielectric Constant Type
≤7.5%/ ≤10%/ ≤12.5% ≤15%/
≤5%/ ≤7%/
≤7.5% ≤10%
≤12.5% ≤12.5%
(Whichever is Smaller)
≤5%
≤9%
: Within ±30%
: Within ±30%
≤7%
≤9%
≤5%/ ≤7.5%/ ≤7.5%/
≤9% ≤12.5%/
≤12.5%
16V
16V
≤10% ≤12.5% ≤12.5%
≤7%
≤15%
10V
10V
≤10% ≤10%
≤15%
≤20%
Multi Layer Ceramic Capacitors
≤20%
≤15%
6.3V
6.3V
- Substrate Material :
- Board Thickness :
※ Test Condition
- Bending Limit : 1mm
- Pressurizing Speed : 1mm/sec
The capacitor should be subjected
to a simple harmonic motion having
a total amplitude of 1.5mm, the
frequency being varied uniformly
between the approximate limits of
10 and 55Hz, shall be traversed(from
10Hz to 55Hz then 10Hz again) in
approximately 1 minute.
This motion shall be applied for a
period of 2 hours in each 3mutually
perpendicular directions(total is
6hours).
- Temperature : 40±2℃
- Humidity : 90~95%
- Hour : 500±12hours
- Measurement after test
(temperature compensating type) or
1.6mm
0.8mm(0603/1005size)
Take it out and set it for 24±2 hours
48±4 hours(high dielectric constant
type) at room temperature, then
measure.
Glass EPOXY Board
Shown in Fig. After soldering and
then let sit for 24+4hr(temperature
compensating type), 48±4hr (high
dielectric constant type) at room
temperature.
and Conditions
Test Methods
SMD Type
23