IRHNJ3130 IRF [International Rectifier], IRHNJ3130 Datasheet

no-image

IRHNJ3130

Manufacturer Part Number
IRHNJ3130
Description
100V, N-CHANNEL RAD-Hard HEXFET MOSFET TECHNOLOGY
Manufacturer
IRF [International Rectifier]
Datasheet
Product Summary
International Rectifier’s RAD-Hard
technology provides high performance power MOSFETs
for space applications. This technology has over a de-
cade of proven performance and reliability in satellite
applications. These devices have been characterized
for both Total Dose and Single Event Effects (SEE). The
combination of low R
the power losses in switching applications such as DC
to DC converters and motor control. These devices re-
tain all of the well established advantages of MOSFETs
such as voltage control, fast switching, ease of parallel-
ing and temperature stability of electrical parameters.
For footnotes refer to the last page
Absolute Maximum Ratings
I D @ V GS = 12V, T C = 100°C Continuous Drain Current
I D @ V GS = 12V, T C = 25°C
www.irf.com
RADIATION HARDENED
POWER MOSFET
SURFACE MOUNT (SMD-0.5)
Part Number Radiation Level
IRHNJ7130
IRHNJ3130
IRHNJ4130
IRHNJ8130 1000K Rads (Si)
P D @ T C = 25°C
T STG
dv/dt
V GS
E AS
E AR
I DM
I AR
T J
100K Rads (Si)
300K Rads (Si)
600K Rads (Si)
DS(on)
and low gate charge reduces
Parameter
Continuous Drain Current
Pulsed Drain Current
Max. Power Dissipation
Linear Derating Factor
Gate-to-Source Voltage
Single Pulse Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Operating Junction
Storage Temperature Range
Pckg. Mounting Surface Temp.
Weight
TM
R
HEXFET
0.18
0.18
0.18
0.18
DS(on)
®
14.4A
14.4A
14.4A
14.4A
MOSFET
I
D
Features:
n
n
n
n
n
n
n
n
n
n
Single Event Effect (SEE) Hardened
Low R
Low Total Gate Charge
Proton Tolerant
Simple Drive Requirements
Ease of Paralleling
Hermetically Sealed
Ceramic Package
Surface Mount
Light Weight
MOSFET TECHNOLOGY
1.0 (Typical)
DS(on)
300 (for 5s)
100V, N-CHANNEL
-55 to 150
RAD-Hard
14.4
±20
14.4
150
6.0
7.5
58
0.6
9.1
SMD-0.5
75
IRHNJ7130
Pre-Irradiation
HEXFET
PD - 93820
Units
W/°C
V/ns
mJ
mJ
o
A
W
V
A
C
g
2/4/00
1
®

Related parts for IRHNJ3130

IRHNJ3130 Summary of contents

Page 1

... RADIATION HARDENED POWER MOSFET SURFACE MOUNT (SMD-0.5) Product Summary Part Number Radiation Level IRHNJ7130 100K Rads (Si) IRHNJ3130 300K Rads (Si) IRHNJ4130 600K Rads (Si) IRHNJ8130 1000K Rads (Si) International Rectifier’s RAD-Hard technology provides high performance power MOSFETs for space applications. This technology has over a de- cade of proven performance and reliability in satellite applications ...

Page 2

IRHNJ7130 Electrical Characteristics Parameter BV DSS Drain-to-Source Breakdown Voltage BV DSS / T J Temperature Coefficient of Breakdown Voltage R DS(on) Static Drain-to-Source On-State Resistance V GS(th) Gate Threshold Voltage g fs Forward Transconductance I DSS Zero Gate Voltage Drain ...

Page 3

... On-State Resistance (SMD-0.5) V Diode Forward Voltage SD 1. Part numbers IRHNJ7130, IRHNJ3130, IRHNJ4130 2. Part number IRHNJ8130 International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2. Table 2. Single Event Effect Safe Operating Area ...

Page 4

IRHNJ7130 100 VGS TOP 15V 12V 10V 9.0V 8.0V 7.0V 6.0V BOTTOM 5.0V 10 5.0V 1 20µs PULSE WIDTH 0.1 0 Drain-to-Source Voltage (V) DS Fig 1. Typical Output Characteristics 100 ...

Page 5

Pre-Irradiation 2000 1MHz iss rss oss ds gd 1500 C iss 1000 500 C oss C rss ...

Page 6

IRHNJ7130 100 T , Case Temperature ( C) C Fig 9. Maximum Drain Current Vs. Case Temperature 0.50 0.20 0.10 0.05 0.1 0.02 0.01 SINGLE PULSE (THERMAL ...

Page 7

Pre-Irradiation 12V 20V Fig 12a. Unclamped Inductive Test Circuit Fig 12b. Unclamped Inductive Waveforms ...

Page 8

IRHNJ7130 Footnotes: Repetitive Rating; Pulse width limited by maximum junction temperature 25V, starting 25°C, L= 1.4mH, Peak 14.4A 12V I SD 14.4A, di/dt 395A 100V, ...

Related keywords