crcw2512-ele3 Vishay, crcw2512-ele3 Datasheet - Page 4

• Manufacturer Part Number: crcw2512-ele3
• Description: Thick Film, Low Ohmic Chip Resistors
• Manufacturer: Vishay

Document Number: 20042
Revision: 30-Apr-09
TEST PROCEDURES AND REQUIREMENTS
EN 60115-1
TEST
(clause)
Resistance (4.5)
Temperature coefficient (4.8.4.2)
Overload (4.13)
Solderability (4.17.5)
Resistance to soldering heat (4.18.2)
Rapid change of temperature (4.19)
Damp heat, steady state (4.24)
Climatic sequence (4.23)
Endurance at 70 °C (4.25.1)
Extended endurance (4.25.1.8)
Endurance at upper category temperature
(4.25.3)
APPLICABLE SPECIFICATIONS
• EN 60115-1
• EN 140400
• EN 140401-802
• IEC 60068-2-X
• IEC 60286-3
Generic specification
Sectional specification
Detail specification
Variety of environmental test procedures
Packaging of SMD components
For technical questions, contact: [e-mail]
Thick Film, Low Ohmic Chip Resistors
Stability for product types:
16 h at UCT = 125 °C; 1 cycle at 55 °C;
30 min at UCT = 125 °C; 5 cycles
solder bath method; 235 °C; 2 s
Duration: According the style
1 h/1 kPa at 15 °C to 35 °C;
Duration extended to 8000 h
Aging 4 h at 155 °C, dryheat
CONDITIONS OF TEST
30 min at LCT = - 55 °C;
(260 ± 5) °C; (10 ± 1) s
1.5 h ON; 0.5 h OFF;
UCT = 155 °C; 1000 h
2 h at LCT = - 55 °C;
U
(40 ± 2) °C; 56 days;
Solder bath method;
visual examination
5 cycles at 55 °C
20/- 55/20 °C and
=
U
U
70 °C; 1000 h
(93 ± 3) % RH
20/125/20 °C
≤ 2 × U
2.5 x
=
=
P
P
-
70
70
max.
P
x R
x R
70
;
x R
CRCW....-EL e3
Good tinning (≥ 95 % covered)
CRCW....-EL e3
± 700 ppm/K, ± 600 ppm/K,
± 400 ppm/K, ± 300 ppm/K,
± 200 ppm/K, ± 100 ppm/K
PERMISSIBLE CHANGE
STABILITY CLASS 2
± (0.5 % R + 0.5 mΩ)
± (0.5 % R + 0.5 mΩ)
± (0.5 % R + 0.5 mΩ)
± (2 % R + 0.5 mΩ)
± (2 % R + 0.5 mΩ)
± (2 % R + 0.5 mΩ)
± (4 % R + 0.5 mΩ)
± (2 % R + 0.5 mΩ)
REQUIREMENTS
no visible damage
10 mΩ to 976 mΩ
OR BETTER
± 1 %, ± 5 %
(ΔR)
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