PALC22V10D-10JC CYPRESS [Cypress Semiconductor], PALC22V10D-10JC Datasheet - Page 4
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PALC22V10D-10JC
Manufacturer Part Number
PALC22V10D-10JC
Description
Flash-erasable Reprogrammable CMOS PAL Device
Manufacturer
CYPRESS [Cypress Semiconductor]
Datasheet
1.PALC22V10D-10JC.pdf
(13 pages)
Document #: 38-03027 Rev. *B
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65
Ambient Temperature with
Power Applied.............................................–55
Supply Voltage to Ground Potential
(Pin 24 to Pin 12) ........................................... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High-Z State ............................................... –0.5V to +7.0V
DC Input Voltage............................................ –0.5V to +7.0V
Electrical Characteristics
Capacitance
Endurance Characteristics
Parameter
V
V
V
V
I
I
I
I
I
C
C
N
Notes:
IX
OZ
SC
CC1
CC2
1. T
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. V
5. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V
6. Tested initially and after any design or process changes that may affect these parameters.
OH
OL
IH
IL
IN
OUT
Parameter
[4]
Parameter
caused by tester ground degradation.
A
[6]
IL
is the “instant on” case temperature.
(Min.) is equal to –3.0V for pulse durations less than 20 ns.
Output HIGH Voltage
Output LOW Voltage
Input HIGH Level
Input LOW Level
Input Leakage Current
Output Leakage Current
Output Short Circuit Current V
Standby Power Supply
Current
Operating Power Supply
Current
Minimum Reprogramming Cycles
[6]
Input Capacitance
Output Capacitance
Description
Description
Description
USE ULTRA37000
ALL NEW DESIGNS
Over the Operating Range
[6]
V
V
V
V
Guaranteed Input Logical HIGH Voltage for All Inputs
Guaranteed Input Logical LOW Voltage for All Inputs
V
V
V
V
Outputs Open in Unprogrammed
Device
V
Output Open, Device Programmed
as a 10-bit Counter,
f = 25 MHz
CC
IN
CC
IN
SS
CC
CC
CC
IN
CC
= V
= V
= GND,
°
°
< V
= Min.,
= Min.,
= Max., V
= Max., V
= Max.,
= Max., V
C to +150
C to +125
IH
IH
IN
V
V
OUT
or V
or V
< V
IN
Test Conditions
= 2.0V @ f = 1 MHz
TM
CC
= 2.0V @ f = 1 MHz
IL
IL
Normal Programming Conditions
SS
OUT
IL
°
°
C
C
, V
= 0V, V
FOR
< V
[2]
= 0.5V
CC
OUT
Test Conditions
= Max.
Output Current into Outputs (LOW)............................. 16 mA
DC Programming Voltage............................................. 12.5V
Latch-up Current..................................................... > 200 mA
Static Discharge Voltage
(per MIL-STD-883, Method 3015) ............................ > 2001V
Operating Range
Test Conditions
Commercial
Industrial
Military
IH
< V
[5,6]
= 3V,
Range
CC
[1]
I
I
I
I
10, 15, 25 ns
5, 7.5 ns
15, 25 ns
10 ns
10, 15, 25 ns
5, 7.5 ns
15, 25 ns
10 ns
OH
OH
OL
OL
= 16 mA
= 12 mA
= –3.2 mA
= –2 mA
Min.
OUT
–55
–40
Temperature
0
= 0.5V has been chosen to avoid test problems
°
°
Ambient
C to +75
°
C to +125
C to +85
Min.
[3]
100
[3]
Com’l
Mil/Ind
Com’l
Mil/Ind
Com’l
Mil/Ind
Com’l
Com’l
Mil/Ind
Mil/Ind
°
Max.
C
°
°
C
10
10
PALCE22V10
C
Max.
Min.
–0.5
–10
–40
–30
2.4
2.0
Page 4 of 13
5V ±10%
5V ±10%
5V ±5%
Max. Unit
–130 mA
Cycles
130
120
120
110
140
130
130
0.5
0.8
V
10
40
90
Unit
Unit
CC
pF
pF
mA
mA
mA
mA
mA
mA
mA
mA
µA
µA
V
V
V
V