BA3830F_11 ROHM [Rohm], BA3830F_11 Datasheet - Page 4

• Manufacturer Part Number: BA3830F_11
• Description: Silicon Monolithic Integrated Circuit
• Manufacturer: ROHM [Rohm]

Application example
(1) Numbers and data in entries are representative design values and are not guaranteed values of the items.
(2) Although we are confident in recommending the sample application circuits, carefully check their
(3) Absolute maximum ratings
(4) GND potential
(5) Thermal design
(6) Shorts between pins and misinstallation
(7) Operation in strong magnetic fields
characteristics further when using them. When modifying externally attached component constants before
use, determine them so that they have sufficient margins by taking into account variations in externally
attached components and the Rohm LSI, not only for static characteristics but also including transient
characteristics.
If applied voltage, operating temperature range, or other absolute maximum ratings are exceeded, the LSI
may be damaged. Do not apply voltages or temperatures that exceed the absolute maximum ratings. If
you think of a case in which absolute maximum ratings are exceeded, enforce fuses or other physical safety
measures and investigate how not to apply the conditions under which absolute maximum ratings are
exceeded to the LSI.
Make the GND pin voltage such that it is the lowest voltage even when operating below it. Actually confirm
that the voltage of each pin does not become a lower voltage than the GND pin, including transient
phenomena.
Perform thermal design in which there are adequate margins by taking into account the allowable power
dissipation in actual states of use.
When mounting the LSI on a board, pay adequate attention to orientation and placement discrepancies of the
LSI. If it is misinstalled and the power is turned on, the LSI may be damaged. It also may be damaged if it
is shorted by a foreign substance coming between pins of the LSI or between a pin and a power supply or a
pin and a GND.
Adequately evaluate use in a strong magnetic field, since there is a possibility of malfunction.
REV. B
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