AT28C64-12TI ATMEL [ATMEL Corporation], AT28C64-12TI Datasheet - Page 2

• Manufacturer Part Number: AT28C64-12TI
• Description: 64K (8K x 8) CMOS E2PROM
• Manufacturer: ATMEL [ATMEL Corporation]

Description (Continued)
Absolute Maximum Ratings*
The AT28C64 is accessed like a Static RAM for the read
or write cycles without the need for external components.
During a byte write, the address and data are latched in-
ternally, freeing the microprocessor address and data bus
for other operations. Following the initiation of a write cy-
cle, the device will go to a busy state and automatically
clear and write the latched data using an internal control
timer. The device includes two methods for detecting the
end of a write cycle, level detection of RDY/BUSY (unless
pin 1 is N.C.) and DATA POLLING of I/O
of a write cycle has been detected, a new access for a
read or write can begin.
Block Diagram
2-194
Temperature Under Bias................. -55°C to +125°C
Storage Temperature...................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground ................... -0.6V to +6.25V
All Output Voltages
with Respect to Ground .............-0.6V to V
Voltage on OE and A9
with Respect to Ground ................... -0.6V to +13.5V
AT28C64/X
7
. Once the end
CC
+ 0.6V
The CMOS technology offers fast access times of 120 ns
at low power dissipation. When the chip is deselected the
standby current is less than 100 A.
Atmel’s 28C64 has additional features to ensure high
quality and manufacturability. The device utilizes error cor-
rection internally for extended endurance and for im-
proved data retention characteristics. An extra 32-bytes of
E
*NOTICE: Stresses beyond those listed under “Absolute Maxi-
2
PROM are available for device identification or tracking.
mum Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of the
device at these or any other conditions beyond those indi-
cated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.