ADM206E Analog Devices, ADM206E Datasheet - Page 11

• Manufacturer Part Number: ADM206E
• Description: EMI/EMC Compliant/ +-15 kV ESD Protected/ RS-232 Line Drivers/Receivers
• Manufacturer: Analog Devices

REV. B
The ADM2xxE family of products are tested using both the
above mentioned test methods. All pins are tested with respect
to all other pins as per the MIL-STD-883B specification. In
addition all I-O pins are tested as per the IEC test specification.
The products were tested under the following conditions:
(a) Power-On—Normal Operation
(b) Power-On—Shutdown Mode
(c) Power-Off
There are four levels of compliance defined by IEC1000-4-2.
The ADM2xxE family of products meet the most stringent
compliance level for both contact and for air-gap discharge. This
means that the products are able to withstand contact discharges in
excess of 8 kV and air-gap discharges in excess of 15 kV.
Figure 26. Human Body Model ESD Current Waveform
0.1 TO 1ns
Figure 27. IEC1000-4-2 ESD Current Waveform
36.8
100
GENERATOR
90
10
100
VOLTAGE
90
10
HIGH
t
RL
Figure 25. ESD Test Standards
ESD TEST METHOD
H. BODY MIL-STD883B
IEC1000-4-2
30ns
R1
t
DL
C1
R2
1.5k
330
60ns
R2
C1
100pF
150pF
TIME t
UNDER TEST
DEVICE
ADM206E/ADM207E/ADM208E/ADM211E/ADM213E
TIME t
–11–
Level
1
2
3
4
ESD Test Method
MIL-STD-883B
IEC1000-4-2
FAST TRANSIENT BURST TESTING (IEC1000-4-4)
IEC1000-4-4 (previously 801-4) covers electrical fast-transient/
burst (EFT) immunity. Electrical fast transients occur as a
result of arcing contacts in switches and relays. The tests simu-
late the interference generated when for example a power relay
disconnects an inductive load. A spark is generated due to the
well known back EMF effect. In fact the spark consists of a
burst of sparks as the relay contacts separate. The voltage appear-
ing on the line, therefore, consists of a bust of extremely fast tran-
sient impulses. A similar effect occurs when switching on
fluorescent lights.
The fast transient burst test defined in IEC1000-4-4 simulates
this arcing and its waveform is illustrated in Figure 28. It con-
sists of a burst of 2.5 kHz to 5 kHz transients repeating at
300 ms intervals. It is specified for both power and data lines.
Contact
Air
V
V
Figure 28. IEC1000-4-4 Fast Transient Waveform
5ns
Table IV. IEC1000-4-2 Compliance Levels
Table V. ADM2xxE ESD Test Results
0.2/0.4ms
Contact Discharge
kV
2
4
6
8
300ms
I-O Pins
15 kV
8 kV
15 kV
50ns
Other Pins
2.5 kV
15ms
Air Discharge
kV
2
4
8
15
t
t