AT28C010 ATMEL Corporation, AT28C010 Datasheet - Page 2

• Manufacturer Part Number: AT28C010
• Description: 1 Megabit 128K x 8 Paged CMOS E2PROM
• Manufacturer: ATMEL Corporation

Absolute Maximum Ratings*
access times to 120 ns with power dissipation of just 440
mW. When the device is deselected, the CMOS standby
current is less than 300 A.
The AT28C010 is accessed like a Static RAM for the read
or write cycle without the need for external components.
The device contains a 128-byte page register to allow writ-
ing of up to 128-bytes simultaneously. During a write cy-
cle, the address and 1 to 128-bytes of data are internally
latched, freeing the address and data bus for other opera-
tions. Following the initiation of a write cycle, the device
will automatically write the latched data using an internal
Block Diagram
2-244
Description (Continued)
Temperature Under Bias................. -55°C to +125°C
Storage Temperature...................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground ................... -0.6V to +6.25V
All Output Voltages
with Respect to Ground .............-0.6V to V
Voltage on OE and A9
with Respect to Ground ................... -0.6V to +13.5V
AT28C010 Mil
CC
+ 0.6V
control timer. The end of a write cycle can be detected by
DATA POLLING of I/O7. Once the end of a write cycle has
been detected a new access for a read or write can begin.
Atmel’s 28C010 has additional features to ensure high
quality and manufacturability. The device utilizes internal
error correction for extended endurance and improved
data retention characteristics. An optional software data
protection mechanism is available to guard against inad-
vertent writes. The device also includes an extra 128-
bytes of E
*NOTICE: Stresses beyond those listed under “Absolute Maxi-
mum Ratings” may cause permanent damage to the device.
This is a stress rating only and functional operation of the
device at these or any other conditions beyond those indi-
cated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
2
PROM for device identification or tracking.