LMZ12003TZ-ADJ NSC [National Semiconductor], LMZ12003TZ-ADJ Datasheet - Page 5

• Manufacturer Part Number: LMZ12003TZ-ADJ
• Manufacturer: NSC [National Semiconductor]

Note 1: Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating Ratings are conditions under which operation of the
device is intended to be functional. For guaranteed specifications and test conditions, see the Electrical Characteristics.
Note 2: The human body model is a 100pF capacitor discharged through a 1.5 kΩ resistor into each pin. Test method is per JESD-22-114.
Note 3: Min and Max limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlation using Statistical
Quality Control (SQC) methods. Limits are used to calculate National’s Average Outgoing Quality Level (AOQL).
Note 4: Typical numbers are at 25°C and represent the most likely parametric norm.
Note 5: EN 55022:2006, +A1:2007, FCC Part 15 Subpart B: 2007. See AN-2024 and layout for information on device under test.
Note 6: Theta JA measured on a 1.705” x 3.0” four layer board, with one ounce copper, thirty five 12 mil thermal vias, no air flow, and 1W power dissipation.
Refer to PCB layout diagrams
Typical Performance Characteristics
Unless otherwise specified, the following conditions apply: V
bient = 25 C for efficiency curves and waveforms.
Symbol
η
η
Parameter
Efficiency
Efficiency
Efficiency 12V Input @ 25°C
Efficiency 6V Input @ 25°C
Conditions
V
V
30109021
IN
IN
30109003
= 12V V
= 12V V
O
O
IN
= 1.8V I
= 1.8V I
= 12V; Cin = 10uF X7R Ceramic; C
5
O
O
= 1A
= 3A
Dissipation 12V Input @ 25°C
Dissipation 6V Input @ 25°C
(Note
Min
3)
O
= 100uF X7R Ceramic; Tam-
(Note
Typ
87
77
4)
(Note
30109022
30109004
Max
www.national.com
3)
Units
%
%