MC74LVX373DTR2 ON Semiconductor, MC74LVX373DTR2 Datasheet - Page 5

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MC74LVX373DTR2

Manufacturer Part Number
MC74LVX373DTR2
Description
IC LATCH TRANSP OCT 3ST 20-TSSOP
Manufacturer
ON Semiconductor
Series
74LVXr
Datasheet

Specifications of MC74LVX373DTR2

Logic Type
D-Type Transparent Latch
Circuit
8:8
Output Type
Tri-State
Voltage - Supply
2 V ~ 3.6 V
Independent Circuits
1
Delay Time - Propagation
5.8ns
Current - Output High, Low
4mA, 4mA
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
20-TSSOP
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
*This package is inherently Pb−Free.
ORDERING INFORMATION
Specifications Brochure, BRD8011/D.
MC74LVX373DWR2
MC74LVX373DWR2G
MC74LVX373DTR2
MC74LVX373M
MC74LVX373MG
MC74LVX373MEL
MC74LVX373MELG
OE
O
O
O
D
Figure 7. Propagation Delay Test Circuit
t
*Includes all probe and jig capacitance
PLH
50%
50% VCC
DEVICE
50% VCC
UNDER
50% VCC
TEST
50%
Device
t
t
PZL
PZH
Figure 3.
Figure 5.
t
t
PHZ
PLZ
OUTPUT
TEST POINT
C
VOL −0.3V
VOL +0.3V
L
*
t
PHL
V
GND
HIGH
IMPEDANCE
HIGH
IMPEDANCE
SWITCHING WAVEFORMS
CC
V
GND
CC
http://onsemi.com
TEST CIRCUITS
MC74LVX373
TSSOP−20*
SOEIAJ−20
SOEIAJ−20
SOEIAJ−20
SOEIAJ−20
(Pb−Free)
(Pb−Free)
(Pb−Free)
SOIC−20
SOIC−20
Package
5
DEVICE
UNDER
TEST
LE
O
Figure 8. Three−State Test Circuit
LE
D
*Includes all probe and jig capacitance
OUTPUT
50%
50% VCC
TEST POINT
t
w
t
PLH
50%
C
1 kW
Figure 4.
Figure 6.
t
L
su
*
1000 Tape & Reel
1000 Tape & Reel
2500 Tape & Reel
2000 Tape & Reel
2000 Tape & Reel
VALID
50 Units / Rail
50 Units / Rail
Shipping
t
PHL
50%
CONNECT TO V
TESTING t
CONNECT TO GND WHEN
TESTING t
t
h
PLZ
PHZ
AND t
AND t
CC
V
GND
CC
WHEN
PZL
PZH
V
GND
V
GND
CC
CC
.
.

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