K4H560438E-TC/LA2 SAMSUNG [Samsung semiconductor], K4H560438E-TC/LA2 Datasheet - Page 17

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K4H560438E-TC/LA2

Manufacturer Part Number
K4H560438E-TC/LA2
Description
DDR SDRAM 256Mb E-die (x4, x8)
Manufacturer
SAMSUNG [Samsung semiconductor]
Datasheet
System Characteristics for DDR SDRAM
The following specification parameters are required in systems using DDR333, DDR266 & DDR200 devices to ensure
proper system performance. these characteristics are for system simulation purposes and are guaranteed by design.
Table 1 : Input Slew Rate for DQ, DQS, and DM
Table 2 : Input Setup & Hold Time Derating for Slew Rate
Table 3 : Input/Output Setup & Hold Time Derating for Slew Rate
Table 4 : Input/Output Setup & Hold Derating for Rise/Fall Delta Slew Rate
Table 5 : Output Slew Rate Characteristice (X4, X8 Devices only)
Table 6 : Output Slew Rate Characteristice (X16 Devices only)
Table 7 : Output Slew Rate Matching Ratio Characteristics
DDR SDRAM 256Mb E-die (x4, x8)
PARAMETER
DQ/DM/DQS input slew rate measured between
VIH(DC), VIL(DC) and VIL(DC), VIH(DC)
PARAMETER
Output Slew Rate Matching Ratio (Pullup to Pulldown)
Slew Rate Characteristic
Slew Rate Characteristic
Input Slew Rate
Input Slew Rate
Delta Slew Rate
+/- 0.25 V/ns
+/- 0.0 V/ns
+/- 0.5 V/ns
Pullup Slew Rate
Pullup Slew Rate
0.5 V/ns
0.4 V/ns
0.3 V/ns
0.5 V/ns
0.4 V/ns
0.3 V/ns
Pulldown slew
Pulldown slew
AC CHARACTERISTICS
AC CHARACTERISTICS
+100
∆tDS
+150
∆tDS
+100
∆tIS
+50
+75
+50
0
0
0
Typical Range
Typical Range
1.2 ~ 2.5
1.2 ~ 2.5
1.2 ~ 2.5
1.2 ~ 2.5
(V/ns)
(V/ns)
∆tDH
∆tDH
+150
+100
∆tIH
+75
+50
0
0
0
0
0
Minimum
Minimum
(V/ns)
(V/ns)
1.0
0.7
1.0
0.7
DCSLEW
SYMBOL
TBD
MIN
DDR266B
Units
Units
Units
ps
ps
ps
ps
ps
ps
ps
ps
ps
Maximum
Maximum
MAX
TBD
TBD
MIN
(V/ns)
(V/ns)
4.5
4.5
5.0
5.0
DDR333
Notes
Notes
Notes
0.67
MIN
MAX
TBD
k
k
k
i
i
i
j
j
j
DDR200
a,c,d,f,g,h
b,c,d,f,g,h
a,c,d,f,g,h
b,c,d,f,g,h
Notes
Notes
MAX
TBD
1.5
MIN
DDR266
MAX
TBD
Notes
e,m
MIN
0.5
DDR200
Rev. 1.3 April. 2005
MAX
4.0
DDR SDRAM
Units
V/ns
Notes
a, m

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