AR629A-U9MIO NSC [National Semiconductor], AR629A-U9MIO Datasheet - Page 15

Manufacturer Part Number

AR629A-U9MIO

Description

MICROCIRCIT DATA SHEET

Manufacturer

NSC [National Semiconductor]

Datasheet

1.AR629A-U9MIO.pdf (17 pages)

MNAR629A-X REV 0A0

(Continued)

Note 1:

Note 2:

Note 3:

Note 4:

Note 5:

Note 6:

Note 7:

Note 8:

Note 9:

Note 10: These parameters are measured at 2.0V on the rising and falling edges of a high pulse

Note 11: Same as NSC symbol TWTXOH and TWTXOL.

Note 12: TWH is measured from 0.75Vdd on the clock rising edge and 0.75Vdd -1.0V on the clock

Tested during initial qual only and after process/design changes; tested at 25 C

only.

TTL input only.

All output leakage current is measured at tri-state.

Same as NSC symbol TDAE.

Same as NSC symbol TDBUSQRIVS.

Same as NSC symbol TDRIVSRIVS.

Same as NSC symbol TDES.

Same as NSC symbol TDSE.

Same as NSC symbol TWTXO.

and extrapolated to 0.8V on the rising and falling edges of a low pulse.

falling edge.

rising edge.

1.0V/nS.

The clock used to measure these parameters has a minimum slew rate of

TWL is measured from 1V on the clock falling edge and 2V on the clock

MICROCIRCUIT DATA SHEET