HEDL-5500 AVAGO [AVAGO TECHNOLOGIES LIMITED], HEDL-5500 Datasheet
HEDL-5500
Manufacturer Part Number
HEDL-5500
Description
Motion Sensing Products, Optical Encoder Modules
Manufacturer
AVAGO [AVAGO TECHNOLOGIES LIMITED]
Datasheet
1.HEDL-5500.pdf
(2 pages)
HEDL-5500, HEDL-5600, HEDL-6500, HEDL-9x00 Series
Motion Sensing Products, Optical Encoder Modules
Reliability Data Sheet
Description
The following cumulative test results have been obtained
in accordance with the latest revisions of JEDEC standards
Avago tests parts at the absolute maximum rated condi-
tions recommended for the device. The actual perfor-
mance you obtain from Avago parts depends on the
electrical and environmental characteristics of your appli-
cation but will probably be better than the performance
outlined in Table 1.
Table 1. Life Tests
Demonstrated Performance
from testing performed at Avago Technologies Malaysia
Test Name
High Temperature Operating Life
Stress Test Conditions
Vcc=5.0V, T
A
=00°C
Total Device
Hours
30,000
Failure Rate Prediction
The failure rate of semiconductor devices is determined
by the junction temperature of the device. The relation-
ship between ambient temperature and actual junction
temperature is given by the following:
T
where T
θ
P
The estimated MTTF and failure rate at temperatures
lower than the actual stress temperature can be deter-
mined by using an Arrhenius model for temperature
acceleration. Results of such calculations are shown in
the table below using an activation energy of 0.43eV
(reference MIL-HDBK-217).
J
AVG
JA
(°C) = T
= thermal resistance of junction-to-ambient in °C/Watt
= average power dissipated in Watt
Units
Tested
30
A
A
= ambient temperature in °C
(°C) + θ
JA
Total
Failed
0
P
AVG
[3]
Point Typical Performance
MTTF
32,700
Failure Rate
(% /1 K Hours)
3.06
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HEDL-5500 Summary of contents
Page 1
... HEDL-5500, HEDL-5600, HEDL-6500, HEDL-9x00 Series Motion Sensing Products, Optical Encoder Modules Reliability Data Sheet Description The following cumulative test results have been obtained from testing performed at Avago Technologies Malaysia in accordance with the latest revisions of JEDEC standards Avago tests parts at the absolute maximum rated condi- tions recommended for the device ...
Page 2
Table 2. Ambient Junction Temperature (°C) Temperature (°C) 00 Notes: 1. The point typical MTTF (which represents 60% confidence level) is the total device hours divided by ...