MM-JESD22-A115-A AVAGO [AVAGO TECHNOLOGIES LIMITED], MM-JESD22-A115-A Datasheet

MM-JESD22-A115-A

Manufacturer Part Number

MM-JESD22-A115-A

Description

Reflective Surface Mount Optical Encoder

Manufacturer

AVAGO [AVAGO TECHNOLOGIES LIMITED]

Datasheet

1.MM-JESD22-A115-A.pdf (2 pages)

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AEDR-8400-140 and AEDR-8400-142

Reflective Surface Mount Optical Encoder

Reliability Data Sheet

Description

The following cumulative test results have been obtained

from testing performed at Avago Technologies Malaysia

in accordance with the latest revisions of JEDEC Standard.

Avago tests parts at the absolute maximum rated condi-

tions recommended for the device. The actual perfor-

mance you obtain from Avago parts depends on the

electrical and environmental characteristics of your appli-

cation but will probably be better than the performance

outlined in Table 1.

Table 1. Life Tests

Demonstrated Performance

Table 2.

Test Name

High Temperature

Operating Life

Ambient

Temperature

(°C)

Stress Test

Conditions

1500hours

=3.0V, T

Junction

Temperature

(°C)

89.7

79.7

69.7

59.7

49.7

39.7

29.7

=85°C,

Point Typical Performance

in Time

MTTF

49,180

72,640

109,800

170,000

270,700

443,800

751,900

Total Device

Hours

45,000

[1]

Units

Tested

Failure Rate

(% / 1K Hours)

2.03

1.38

0.91

0.59

0.37

0.23

0.13

Failure Rate Prediction

The failure rate of semiconductor devices is determined

by the junction temperature of the device. The relation-

ship between ambient given by the following:

Where,

Watt

The estimated MTTF and failure rate at temperatures

lower than the actual stress temperature can be deter-

mined by using an Arrhenius model for temperature

acceleration. Results of such calculations are shown in

the table below using an activation energy of 0.43eV

(reference MIL-HDBK-217).

AVG

[1]

(°C) = T

= ambient temperature in °C

= thermal resistance of junction-to-ambient in °C/

= average power dissipated in Watt

(°C) + q

Total

Failed

Performance in Time

(90% Confidence)

MTTF

19,520

28,840

43,580

67,500

107,400

176,200

298,500

AVG

[2]

Point Typical Performance

MTTF

49,180

[2]

Failure Rate

(% /1K Hours)

5.12

3.47

2.29

1.48

0.93

0.57

0.34

Failure Rate

(% /1 K Hours)

2.03

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MM-JESD22-A115-A Summary of contents

Page 1

... Avago Technologies Malaysia in accordance with the latest revisions of JEDEC Standard. Avago tests parts at the absolute maximum rated condi- tions recommended for the device. The actual perfor- mance you obtain from Avago parts depends on the electrical and environmental characteristics of your appli- cation but will probably be better than the performance outlined in Table 1 ...

Page 2

... RH=85%, 1000 hours A Table 4. Electrical Tests Test Name Reference ESD- Human Body Model HBM-JESD22-A114D ESD- Machine Model MM-JESD22-A115-A Table 5. Mechanical and Vibration shock Test Name Test Conditions Mechanical Shock 15,20,30g 11ms, 5 successive shocks in each direction of 3 perpendicular axes of units Vibration Shock 15,25,30g 20-2kHz, 10 cycles for ach g level ...

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