K7R321884M-FC16 SAMSUNG [Samsung semiconductor], K7R321884M-FC16 Datasheet - Page 12
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K7R321884M-FC16
Manufacturer Part Number
K7R321884M-FC16
Description
1Mx36 & 2Mx18 QDRTM II b4 SRAM
Manufacturer
SAMSUNG [Samsung semiconductor]
Datasheet
1.K7R321884M-FC16.pdf
(18 pages)
K7R321884M
THERMAL RESISTANCE
Note: Junction temperature is a function of on-chip power dissipation, package thermal impedance, mounting site temperature and mounting site
K7R323684M
PIN CAPACITANCE
Note: 1. Parameters are tested with RQ=250
APPLICATION INRORMATION
Junction to Ambient
Junction to Case
Junction to Pins
MEMORY
CONTROLLER
Address Control Input Capacitance
Input and Output Capacitance
Clock Capacitance
thermal impedance. T
2. Periodically sampled and not 100% tested.
SRAM1 Input CQ
SRAM1 Input CQ
SRAM4 Input CQ
SRAM4 Input CQ
Source CLK
Source CLK
Return CLK
Return CLK
Data Out
Address
PRMETER
Data In
PRMETER
BW
W
R
J
=T
A
Vt
+ P
R
R=50
D
x
JA
Vt
Vt
Vt=V
D
SA
and V
REF
R W BW
DDQ
SYMBOL
=1.5V.
C
C
C
OUT
CLK
IN
SRAM#1
SYMBOL
0
JC
JA
JB
BW
1
- 12 -
TESTCONDITION
C C
1Mx36 & 2Mx18 QDR
V
V
OUT
K
IN
CQ
CQ
Q
ZQ R=250
=0V
-
K
=0V
TYP
20.8
2.3
4.3
TYP
D
SA
R
4
6
5
Vt
Vt
RW BW
MAX
5
7
6
SRAM#4
TM
0
Unit
C
C
C
BW
/W
/W
/W
II b4 SRAM
Unit
pF
pF
pF
1
C C
NOTES
Dec. 2003
NOTES
K
CQ
ZQ
CQ
ZQ
Q
Rev 2.0
K
R=250