MX29LAA641D MCNIX [Macronix International], MX29LAA641D Datasheet - Page 58

• Manufacturer Part Number: MX29LAA641D
• Description: 64M-BIT [4M x 16/8M x 8] CMOS EQUAL SECTOR
• Manufacturer: MCNIX [Macronix International]

Notes:
1. Typical program and erase times assume the following conditions: 25° C, 3.0V VCC. Programming specifications
2. Maximum values are measured at VCC = 3.0 V, worst case temperature. Maximum values are valid up to and
3. Word/Byte programming specification is based upon a single word/byte programming operation not utilizing the
4. Erase/Program cycles comply with JEDEC JESD-47E & A117A standard.
Notes:
1. Test conditions TA=25° C, f=1.0MHz.
P/N:PM1289
PIN CAPACITANCE
LATCH-UP CHARACTERISTICS
ERASE AND PROGRAMMING PERFORMANCE
Parameter Symbol
CIN
COUT
CIN2
Input Voltage voltage difference with GND on WP#/ACC, A9, OE#, RESET# pins
Input Voltage voltage difference with GND on all I/O pins
Vcc current pulse
Includes all pins except Vcc. Test conditions: Vcc = 3.0V, one pin at a time.
PARAMETER
Sector Erase Time
Chip Erase Time
Word Programming Time
Byte Programming Time
Accelerated Byte/Word Program Time
Chip Programming Time
Erase/Program Cycles
assume checkboard data pattern.
including 100,000 program/erase cycles.
write buffer.
Parameter Description
Input Capacitance
Output Capacitance
Control Pin Capacitance
Byte mode
Word mode
58
MIN.
MX29LA641D H/L
Test Set
VIN=0
VOUT=0
VIN=0
TYP.(2)
100,000
LIMITS
0.7
45
11
50
45
9
7
TYP
8.5
7.5
6
-100mA
MAX.
-1.0V
-1.0V
MIN.
360
300
210
160
140
65
2
MAX
7.5
12
9
REV. 1.1, JAN. 06, 2009
Cycles
UNITS
1.5 x Vcc
+100mA
UNIT
sec
sec
sec
sec
10.5V
MAX.
pF
pF
pF
us
us
us