MX29LV065B ETC1 [List of Unclassifed Manufacturers], MX29LV065B Datasheet - Page 20

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MX29LV065B

Manufacturer Part Number
MX29LV065B
Description
64M-BIT [8M x 8] CMOS EQUAL SECTOR FLASH MEMORY
Manufacturer
ETC1 [List of Unclassifed Manufacturers]
Datasheet
AC CHARACTERISTICS TA = 0
Table 9. READ OPERATIONS
TEST CONDITIONS:
• Input pulse levels: 0V/3.0V.
• Input rise and fall times is equal to or less than 5ns.
• Output load: 1 TTL gate + 100pF (Including scope and
• Reference levels for measuring timing: 1.5V.
P/N:PM1115
SYMBOL
tRC
tACC
tCE
tOE
tDF
tOEH
tOH
jig), for 29LV081B-90. 1 TTL gate + 30pF (Including
scope and jig) for 29LV081B-70.
PARAMETER
Read Cycle Time (Note 1)
Address to Output Delay
CE to Output Delay
OE to Output Delay
OE High to Output Float (Note1)
Output Enable
Hold Time
Address to Output hold
Read
Toggle and Data Polling
o
C to 70
o
C, VCC = 2.7V~3.6V
29LV081B-70
MIN.
70
0
0
10
0
20
NOTE:
1. Not 100% tested.
2. tDF is defined as the time at which the output achieves the
open circuit condition and data is no longer driven.
70
MAX. MIN.
70
30
25
29LV081B-90
90
0
10
0
0
MX29LV081B
90
90
MAX.
35
30
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
REV. 1.1, DEC. 20, 2004
CONDITIONS
CE=OE=VIL
OE=VIL
CE=OE=VIL
CE=VIL
CE=VIL

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