LC4256C-3FTN256AC Lattice, LC4256C-3FTN256AC Datasheet - Page 41
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LC4256C-3FTN256AC
Manufacturer Part Number
LC4256C-3FTN256AC
Description
CPLD - Complex Programmable Logic Devices 256MC 128I/O ispJTAG 1.8V 3ns
Manufacturer
Lattice
Datasheet
1.LC4384C-5FTN256C.pdf
(99 pages)
Specifications of LC4256C-3FTN256AC
Rohs
yes
Memory Type
EEPROM
Number Of Macrocells
256
Maximum Operating Frequency
384.6 MHz
Delay Time
3 ns
Number Of Programmable I/os
160
Operating Supply Voltage
1.8 V
Maximum Operating Temperature
+ 90 C
Minimum Operating Temperature
0 C
Package / Case
FTBGA
Mounting Style
SMD/SMT
Number Of Product Terms Per Macro
80
Factory Pack Quantity
450
Supply Current
2.5 mA
Supply Voltage - Max
1.95 V
Supply Voltage - Min
1.65 V
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
LC4256C-3FTN256AC
Manufacturer:
Lattice Semiconductor Corporation
Quantity:
10 000
Lattice Semiconductor
Switching Test Conditions
Figure 12 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 11.
Figure 12. Output Test Load, LVTTL and LVCMOS Standards
Table 11. Test Fixture Required Components
LVCMOS I/O, (L -> H, H -> L)
LVCMOS I/O (Z -> H)
LVCMOS I/O (Z -> L)
LVCMOS I/O (H -> Z)
LVCMOS I/O (L -> Z)
1. C
L
includes test fixtures and probe capacitance.
Test Condition
DUT
106 106
106
106
R
1
106
106
R
2
V
R 1
R 2
41
CCO
35pF
35pF
35pF
5pF
5pF
C
L
ispMACH 4000V/B/C/Z Family Data Sheet
1
C L
LVCMOS 3.3 = 1.5V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
1.5V
1.5V
V
V
OH
OL
+ 0.3
- 0.3
0213A/ispm4k
Timing Ref.
Point
Test
CCO
CCO
/2
/2
LVCMOS 3.3 = 3.0V
LVCMOS 2.5 = 2.3V
LVCMOS 1.8 = 1.65V
3.0V
3.0V
3.0V
3.0V
V
CCO