MAX1180ECM-TD Maxim Integrated, MAX1180ECM-TD Datasheet - Page 18

• Manufacturer Part Number: MAX1180ECM-TD
• Description: Analog to Digital Converters - ADC
• Manufacturer: Maxim Integrated

Specifications of MAX1180ECM-TD

• Number Of Channels: 2
• Architecture: Pipeline
• Conversion Rate: 105 MSPs
• Resolution: 10 bit
• Input Type: Single-Ended/Differential
• Snr: 59 dB
• Interface Type: Parallel
• Operating Supply Voltage: 3.3 V
• Maximum Operating Temperature: + 85 C
• Package / Case: TQFP EP
• Maximum Power Dissipation: 511 mW
• Minimum Operating Temperature: - 40 C
• Number Of Converters: 2
• Voltage Reference: Internal, External

Dual 10-Bit, 105Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straight
line can be either a best straight-line fit or a line drawn
between the endpoints of the transfer function, once
offset and gain errors have been nullified. The static lin-
earity parameters for the MAX1180 are measured using
the best straight-line fit method.
Differential nonlinearity is the difference between an
actual step-width and the ideal value of 1LSB. A DNL
error specification of less than 1LSB guarantees no
missing codes and a monotonic transfer function.
Figure 9 depicts the aperture jitter (t
sample-to-sample variation in the aperture delay.
Aperture delay (t
falling edge of the sampling clock and the instant when
an actual sample is taken (Figure 9).
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error).
Figure 9. T/H Aperture Timing
18
______________________________________________________________________________________
Dynamic Parameter Definitions
DATA (T/H)
SAMPLED
ANALOG
Static Parameter Definitions
INPUT
CLK
T/H
t
AD
Differential Nonlinearity (DNL)
TRACK
AD
Signal-to-Noise Ratio (SNR)
) is the time defined between the
Integral Nonlinearity (INL)
t
HOLD
AJ
Aperture Delay
Aperture Jitter
AJ
TRACK
), which is the
The ideal, theoretical minimum analog-to-digital noise is
caused by quantization error only and results directly
from the ADCs resolution (N-Bits):
In reality, there are other noise sources besides quanti-
zation noise; thermal noise, reference noise, clock jitter,
etc. SNR is computed by taking the ratio of the RMS
signal to the RMS noise, which includes all spectral
components minus the fundamental, the first five har-
monics, and the DC offset.
SINAD is computed by taking the ratio of the RMS sig-
nal to all spectral components minus the fundamental
and the DC offset.
ENOB specifies the dynamic performance of an ADC at
a specific input frequency and sampling rate. An ideal
ADC’s error consists of quantization noise only. ENOB
is computed from:
THD is typically the ratio of the RMS sum of the first four
harmonics of the input signal to the fundamental itself.
This is expressed as:
where V
V
harmonics.
SFDR is the ratio expressed in decibels of the RMS
amplitude of the fundamental (maximum signal compo-
nent) to the RMS value of the next largest spurious
component, excluding DC offset.
The two-tone IMD is the ratio expressed in decibels of
either input tone to the worst 3rd-order (or higher) inter-
modulation products. The individual input tone levels
are at -6.5dB full scale.
5
are the amplitudes of the 2nd- through 5th-order
Signal-to-Noise Plus Distortion (SINAD)
THD
Spurious-Free Dynamic Range (SFDR)
1
is the fundamental amplitude, and V
=
20
Effective Number of Bits (ENOB)
Intermodulation Distortion (IMD)
Total Harmonic Distortion (THD)
SNR
ENOB
×
log
[max]
10
=
SINAD
= 6.02


 

V
2
6 02
2
dB
.
✕
+
N + 1.76
−1 76
V
3
.
2
V
+
1
V
4
2
+
V
2
5
through
2


 
