CAV24C32YE-GT3 ON Semiconductor, CAV24C32YE-GT3 Datasheet - Page 2
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CAV24C32YE-GT3
Manufacturer Part Number
CAV24C32YE-GT3
Description
EEPROM 32KB I2C SER EEPROM
Manufacturer
ON Semiconductor
Datasheet
1.CAV24C32YE-GT3.pdf
(10 pages)
Specifications of CAV24C32YE-GT3
Product Category
EEPROM
Rohs
yes
Memory Size
32 Kbit
Organization
4 K x 8
Data Retention
100 Years
Maximum Clock Frequency
0.1 MHz
Maximum Operating Current
2 mA
Operating Supply Voltage
3.3 V, 5 V
Maximum Operating Temperature
+ 125 C
Package / Case
TSSOP-8
Access Time
3500 ns
Interface Type
IC2
Minimum Operating Temperature
- 40 C
Supply Voltage - Max
5.5 V
Supply Voltage - Min
2.5 V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. During input transitions, voltage undershoot on any pin should not exceed −1 V for more than 20 ns. Voltage overshoot on pins A
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
3. Page Mode, V
Table 1. ABSOLUTE MAXIMUM RATINGS
Table 2. RELIABILITY CHARACTERISTICS
Table 3. D.C. OPERATING CHARACTERISTICS
Storage Temperature
Voltage on any Pin with Respect to Ground (Note 1)
N
Symbol
and WP should not exceed V
maximum ratings, irrespective of V
and JEDEC test methods.
END
I
I
V
CCW
CCR
V
V
Symbol
I
SB
OL
I
IH
IL
L
T
(Note 3)
DR
C32F
A
Y
M
XXX
G
Read Current
Write Current
Standby Current
I/O Pin Leakage
Input Low Voltage
Input High Voltage
Output Low Voltage
CC
= Specific Device Code
= Assembly Location
= Production Year (Last Digit)
= Production Month (1-9, O, N, D)
= Last Three Digits of Assembly Lot Number
= Pb−Free Package
Endurance
Data Retention
= 5 V, 25°C.
Parameter
(TSSOP−8)
AYMXXX
C32F
G
CC
+ 1 V for more than 20 ns, while voltage on the I
CC
Parameters
.
All I/O Pins at GND or V
V
Read, f
Write, f
CC
A
Pin at GND or V
0
> 2.5 V, I
SCL and SDA
, A
Parameter
1
SCL
(Note 2)
SCL
, A
2
= 400 kHz
= 400 kHz
DEVICE MARKINGS
and WP
OL
(
http://onsemi.com
V
CC
Test Conditions
= 3 mA
CC
= 2.5 V to 5.5 V, T
CC
2
T
A
= −40°C to +125°C
24C32F = Specific Device Code
A
Y
M
XXX
G
2
A
C bus pins, SCL and SDA, should not exceed the absolute
= −40°C to +125°C, unless otherwise specified.)
= Assembly Location
= Production Year (Last Digit)
= Production Month (1-9, O, N, D)
= Last Three Digits of Assembly Lot Number
= Pb−Free Package
(SOIC−8)
AYMXXX
1,000,000
24C32F
Min
100
G
0.7 x V
0.7 x V
–65 to +150
–0.5 to +6.5
−0.5
Min
Ratings
CC
CC
Program/Erase Cycles
V
0.3 x V
CC
Max
5.5
0.4
1
2
5
Years
2
+ 0.5
Units
CC
Units
0
Units
°C
, A
V
mA
mA
mA
mA
V
V
V
1
, A
2