LCMXO2-640UHC-6TG144C Lattice, LCMXO2-640UHC-6TG144C Datasheet - Page 26

• Manufacturer Part Number: LCMXO2-640UHC-6TG144C
• Description: FPGA - Field Programmable Gate Array 640 LUTs 108 IO 3.3V 6 Spd
• Manufacturer: Lattice

Specifications of LCMXO2-640UHC-6TG144C

• Rohs: yes
• Maximum Operating Frequency: 133 MHz
• Operating Supply Voltage: 2.5 V, 3.3 V
• Maximum Operating Temperature: + 70 C
• Mounting Style: SMD/SMT
• Package / Case: TQFP-144
• Minimum Operating Temperature: 0 C
• Operating Supply Current: 28 uA
• Factory Pack Quantity: 60

4.5 MachXO2 Product Family High Temperature Storage Life (HTSL)
High Temperature Storage Life (HTSL)
The High Temperature Storage Life test is used to determine the effect of time and temperature, under storage
conditions, for thermally activated failure mechanisms. Consistent with JEDEC JESD22-A103C, the devices are
subjected to high temperature storage Condition B: +150 (-0/+10) °C for 1000 hours. Prior to High Temperature
Storage, all MachXO2 devices are subjected to Surface Mount Preconditioning as mentioned in Table 4.1.1.
This is a relatively new requirement consistent with JESD47F for Pb-free, wirebonded packages.
MSL3 Packages: TQFP, csBGA, QFN
Stress Duration: 168, 500, 1000, 1500 hours.
Temperature: 150°C (ambient)
Method: Lattice Document # 87-101925 and JESD22-A103C / JESD22-A117A
Table 4.5.1: MachXO2 High Temperature Storage Life Results
* 1 unit failed for “opens” due to handling damage.
** 1 unit failed for “opens” due to handling damage.
INDEX Return
Sample size reduced by one.
Sample size reduced by one.
Product Name
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-1200
LCMXO2-7000
LCMXO2-7000
LCMXO2-7000
LXMXO2-4000
LXMXO2-4000
LXMXO2-4000
LCMXO2-256
LCMXO2-256
LCMXO2-256
LCMXO2-256
LCMXO2-256
132csBGA
132csBGA
132csBGA
184csBGA
184csBGA
184csBGA
484fpBGA
484fpBGA
484fpBGA
144TQFP
144TQFP
144TQFP
64ucBGA
64ucBGA
Package
32QFN
32QFN
32QFN
ASEKH
ASEKH
ASEKH
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
ASEM
Lot #
Lot Number Quantity
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #3
Lot #1
Lot #2
Lot #3
81**
76*
82
82
77
80
77
77
77
80
80
80
77
77
77
77
77
26
Fails
# of
MachXO2 Cumulative HTSL failure Rate = 0 / 1,334
MachXO2 Cumulative HTSL device hours = 1,643,000
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
500 Hrs
Result
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Lattice Semiconductor Corporation Doc. #25-106923 Rev. F
1000 Hrs
Result
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1500 Hrs
Result
N/A
N/A
N/A
N/A
N/A
N/A
0
0
0
0
0
0
0
0
0
0
0
Cumulative
115,500
120,000
115,500
115,500
115,500
114,000
115,500
115,500
81,000
82,000
82,000
77,000
80,000
80,000
80,000
77,000
77,000
Hours