CAT93C86VI-G ON Semiconductor, CAT93C86VI-G Datasheet - Page 2

• Manufacturer Part Number: CAT93C86VI-G
• Description: IC EEPROM 16KBIT 3MHZ 8SOIC
• Manufacturer: ON Semiconductor

Specifications of CAT93C86VI-G

• Format - Memory: EEPROMs - Serial
• Memory Type: EEPROM
• Memory Size: 16K (2K x 8 or 1K x 16)
• Speed: 3MHz
• Interface: Microwire, 3-Wire Serial
• Voltage - Supply: 1.8 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 8-SOIC (3.9mm Width)
• Organization: 2 K x 8 or 1 K x 16
• Interface Type: Microwire
• Maximum Clock Frequency: 0.5 MHz
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 2.5 V
• Maximum Operating Current: 3 mA
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 40 C
• Operating Supply Voltage: 3.3 V, 5 V
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

CAT93C86 (Rev. C)
ABSOLUTE MAXIMUM RATINGS
RELIABILITY CHARACTERISTICS
D.C. OPERATING CHARACTERISTICS
V
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20ns. Maximum DC
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) These parameters are tested initially and after a design or process change that affects the parameter.
(5) Latch-up protection is provided for stresses up to 100 mA pn address and data pins from –1V to V
Doc. No. MD-1091 Rev. R
Parameters
Temperature Under Bias
Storage Temperature
Voltage on any Pin with Respect to Ground
V
Package Power Dissipation Capability (T
Lead Soldering Temperature (10 seconds)
Output Short Circuit Current
Symbol
N
T
V
I
CC
Symbol
LTH
DR
CC
ZAP
END
V
V
V
V
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
voltage on output pins is V
V
V
I
I
V
V
I
I
= +1.8V to +5.5V unless otherwise specified.
I
CC1
CC2
SB1
SB2
(4)
(4)(5)
I
OH1
OH2
LO
OL1
OL2
LI
IH1
IH2
IL1
IL2
with Respect to Ground
(4)
(4)
Power Supply Current (Write)
Power Supply Current (Read)
Power Supply Current
(Standby) (x8 Mode)
Power Supply Current
(Standby) (x16Mode)
Input Leakage Current
Output Leakage Current
(Including ORG pin)
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Parameter
CC
+0.5V, which may overshoot to V
(3)
(1)
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
A
= 25ºC)
Test Conditions
f
f
CS = 0V ORG = GND
CS = 0V ORG = Float or V
V
V
4.5V ≤ V
4.5V ≤ V
1.8V ≤ V
1.8V ≤ V
4.5V ≤ V
4.5V ≤ V
1.8V ≤ V
1.8V ≤ V
SK
SK
(2)
IN
OUT
= 1MHz; V
= 1MHz; V
= 0V to V
= 0V to V
CC
CC
CC
CC
CC
CC
CC
CC
CC
< 5.5V
< 5.5V
< 4.5V
< 4.5V
< 5.5V; I
< 5.5V; I
< 4.5V; I
< 4.5V; I
+2.0V for periods of less than 20ns.
CC
CC
CC
2
CC
= 5.0V
= 5.0V
, CS = 0V
OL
OH
OL
OH
= 2.1mA
= 1mA
= -400µA
= -100µA
CC
V
V
CC
CC
Min
-0.1
1,000,000
2.4
2
0
x 0.7
- 0.2
2000
CC
-2.0 to +V
Min
100
100
+1V.
–55 to +125
-2.0 to +7.0
Characteristics subject to change without notice
–65 to 150
Ratings
Typ
300
100
1.0
0
CC
© 2008 SCILLC. All rights reserved
+2.0
V
V
V
CC
Max
CC
CC
500
0.8
0.4
0.2
Cycles/Byte
10
10
3
1
1
x 0.2
+ 1
+ 1
Years
Units
mA
V
Units
mA
ºC
ºC
ºC
W
V
V
Units
mA
µA
µA
µA
µA
µA
V
V
V
V
V
V
V
V