AT93C46D-TH-T Atmel, AT93C46D-TH-T Datasheet - Page 2
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AT93C46D-TH-T
Manufacturer Part Number
AT93C46D-TH-T
Description
IC EEPROM 1KBIT 2MHZ 8TSSOP
Manufacturer
Atmel
Datasheet
1.AT93C46DY6-YH-T.pdf
(21 pages)
Specifications of AT93C46D-TH-T
Format - Memory
EEPROMs - Serial
Memory Type
EEPROM
Memory Size
1K (128 x 8 or 64 x 16)
Speed
250kHz, 1MHz, 2MHz
Interface
3-Wire Serial
Voltage - Supply
1.8 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Package / Case
8-TSSOP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
AT93C46D-TH-T
Manufacturer:
ATMEL
Quantity:
26 000
Company:
Part Number:
AT93C46D-TH-T
Manufacturer:
ATMEL
Quantity:
3 528
Part Number:
AT93C46D-TH-T
Manufacturer:
ATMEL/爱特梅尔
Quantity:
20 000
1. Absolute Maximum Ratings*
2
Operating Temperature......................................−55°C to +125°C
Storage Temperature .........................................−65°C to +150°C
Voltage on Any Pin
with Respect to Ground ........................................ −1.0V to +7.0V
Maximum Operating Voltage .......................................... 6.25V
DC Output Current........................................................ 5.0 mA
AT93C46D
Figure 1-1.
Notes:
1. When the ORG pin is connected to VCC, the “x 16” organization is selected. When it is con-
2. For the AT93C46D, if the “x 16” organization is the mode of choice and pin 6 (ORG) is left
nected to ground, the “x 8” organization is selected. If the ORG pin is left unconnected and the
application does not load the input beyond the capability of the internal 1 Meg ohm pullup, then
the “x 16” organization is selected.
unconnected, Atmel
AT93C46E datasheet.
Block Diagram
®
recommends using AT93C46E device. For more details, see the
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only, and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
5193F–SEEPR–1/08