25LC320A-I/ST Microchip Technology, 25LC320A-I/ST Datasheet - Page 3

• Manufacturer Part Number: 25LC320A-I/ST
• Description: IC EEPROM 32KBIT 10MHZ 8TSSOP
• Manufacturer: Microchip Technology

Specifications of 25LC320A-I/ST

• Memory Size: 32K (4K x 8)
• Package / Case: 8-TSSOP
• Format - Memory: EEPROMs - Serial
• Memory Type: EEPROM
• Speed: 10MHz
• Interface: SPI, 3-Wire Serial
• Voltage - Supply: 2.5 V ~ 5.5 V
• Operating Temperature: -40°C ~ 85°C
• Organization: 4 K x 8
• Interface Type: SPI
• Maximum Clock Frequency: 10 MHz
• Access Time: 50 ns
• Supply Voltage (max): 5.5 V
• Supply Voltage (min): 2.5 V
• Maximum Operating Current: 5 mA
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 40 C
• Operating Supply Voltage: 3.3 V, 5 V
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant

1.0
Absolute Maximum Ratings
V
All inputs and outputs w.r.t. V
Storage temperature ................................................................................................................................. -65°C to 155°C
Ambient temperature under bias........................................................................................................... -40°C to 150°C
ESD protection on all pins.......................................................................................................................................... 4 kV
TABLE 1-1:
© 2009 Microchip Technology Inc.
† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an
extended period of time may affect device reliability.
DC CHARACTERISTICS
Param.
D001
D002
D003
D004
D005
D006
D007
D008
D009
D010
D011
D012
CC
Note:
No.
Note 1: AEC-Q100 reliability testing for devices intended to operate at 150°C is 1,000 hours. Any design in which
.............................................................................................................................................................................6.5V
ELECTRICAL CHARACTERISTICS
V
V
V
V
V
V
I
I
C
I
I
I
LI
LO
CC
CC
CCS
IH 1
IL 1
IL 2
OL 1
OL 2
OH
INT
Sym.
This parameter is periodically sampled and not 100% tested.
the total operating time between 125°C and 150°C will be greater than 1,000 hours is not warranted with-
out prior written approval from Microchip Technology Inc.
Read
Write
DC CHARACTERISTICS
High-level input
voltage
Low-level input
voltage
Low-level output
voltage
High-level output
voltage
Input leakage current
Output leakage
current
Internal Capacitance
(all inputs and
outputs)
Operating Current
Standby Current
Characteristic
SS
..........................................................................................................-0.6V to V
(†)
Extended (H):
V
.7 V
CC
Min.
-0.3
-0.3
—
—
—
—
—
—
—
—
—
—
-0.5
CC
Preliminary
0.3V
0.2V
V
Max.
CC
0.4
0.2
2.5
±2
±2
10
—
7
5
5
3
T
A
+1
CC
CC
= -40°C to +150°C
Units
mA
mA
mA
mA
μA
μA
pF
μA
V
V
V
V
V
V
V
V
I
I
I
CS = V
CS = V
T
V
V
SO = Open
V
SO = Open
V
V
CS = V
V
OL
OL
OH
A
CC
CC
CC
CC
CC
CC
CC
SS
= 25°C, CLK = 1.0 MHz,
= 2.1 mA
= 1.0 mA
, 150°C
= -400 μA
≥ 2.7V
< 2.7V
= 5.0V (Note)
= 5.5V; F
= 2.5V; F
= 5.5V
= 2.5V
CC
CC
CC
, V
, V
= 5.5V, Inputs tied to V
V
Test Conditions
CC
IN
OUT
CLK
CLK
= V
25LCXXX
= 2.5V to 5.5V
= V
= 5.0 MHz;
= 3.0 MHz;
SS OR
SS OR
DS22131C-page 3
V
CC
V
CC
CC
CC
+1.0V
or
(1)