MAX1785EVMINIQUSB# Maxim Integrated, MAX1785EVMINIQUSB# Datasheet - Page 4

• Manufacturer Part Number: MAX1785EVMINIQUSB#
• Description: Power Management IC Development Tools
• Manufacturer: Maxim Integrated
• Series: MAX1785r

V. Quality Assurance Information
VI. Reliability Evaluation
Maxim Integrated Products. All rights reserved.
A. Quality Assurance Contacts:
B. Outgoing Inspection Level:
C. Observed Outgoing Defect Rate:
D. Sampling Plan:
A. Accelerated Life Test
follows:
1000 hour life test monitors on its processes. This data is published in the Product Reliability Report found at http://www.maxim-
ic.com/.
B. Moisture Resistance Tests
C. E.S.D. and Latch-Up Testing
JESD22-A114. Latch-Up testing has shown that this device withstands a current of +/-100 mA.
=
MTTF
The results of the 135°C biased (static) life test are shown in Table 1. Using these results, the Failure Rate ( ) is calculated as
The following failure rate represents data collected from Maxim’s reliability monitor program. Maxim performs quarterly
The industry standard 85°C/85%RH or HAST testing is monitored per device process once a quarter.
The UC09-1 die type has been found to have all pins able to withstand a HBM transient pulse of +/-500 V per JEDEC
Current monitor data for the S4 Process results in a FIT Rate of 4.6 @ 25C and 79.2 @ 55C (0.8 eV, 60% UCL)
1
= 13.4 x 10
= 13.4 F.I.T. (60% confidence level @ 25°C)
=
-9
(where 4340 = Temperature Acceleration factor assuming an activation energy of 0.8eV)
192 x 4340 x 80 x 2
1.83
(Chi square value for MTTF upper limit)
Ken Wendel (Director, Reliability Engineering)
Bryan Preeshl (Managing Director of QA)
0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
< 50 ppm
Mil-Std-105D
MAX1785EUU+
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