SST25VF040B-50-4I-QAF Microchip Technology, SST25VF040B-50-4I-QAF Datasheet - Page 28
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SST25VF040B-50-4I-QAF
Manufacturer Part Number
SST25VF040B-50-4I-QAF
Description
IC FLASH SER 4MB 50MHZ SPI 8WSON
Manufacturer
Microchip Technology
Datasheets
1.SST25VF512A-33-4C-SAE.pdf
(2 pages)
2.SST25VF040B-80-4I-SAE.pdf
(33 pages)
3.SST25VF040B-80-4I-QAE.pdf
(33 pages)
Specifications of SST25VF040B-50-4I-QAF
Memory Type
FLASH
Memory Size
4M (512K x 8)
Operating Temperature
-40°C ~ 85°C
Package / Case
8-WSON
Format - Memory
FLASH
Speed
50MHz
Interface
SPI Serial
Voltage - Supply
2.7 V ~ 3.6 V
Architecture
Sectored
Interface Type
SPI
Access Time
50 ns
Supply Voltage (max)
3.6 V
Supply Voltage (min)
2.7 V
Maximum Operating Current
15 mA
Mounting Style
SMD/SMT
Organization
32 KB
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Data Sheet
©2009 Silicon Storage Technology, Inc.
AC test inputs are driven at V
for inputs and outputs are V
FIGURE 26: AC Input/Output Reference Waveforms
FIGURE 27: A Test Load Example
V IHT
V ILT
INPUT?
HT
IHT
(0.6V
(0.9V
TO DUT
DD
DD
) and V
V HT
) for a logic “1” and V
V LT
LT
(0.4V
REFERENCE POINTS
DD
). Input rise and fall times (10%
28
TO TESTER
ILT
(0.1V
DD
) for a logic “0”. Measurement reference points
V HT
V LT
1295 TstLd.0
C
L
↔
4 Mbit SPI Serial Flash
OUTPUT
90%) are <5 ns.
Note: V
1295 IORef.0
V
V
V
LT
IHT
ILT
HT
SST25VF040B
- V
- V
- V
- V
S71295-05-000
LOW
HIGH
INPUT
INPUT
Test
Test
LOW Test
HIGH Test
10/09