CAT28F010GI90 ON Semiconductor, CAT28F010GI90 Datasheet - Page 5

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CAT28F010GI90

Manufacturer Part Number
CAT28F010GI90
Description
IC FLASH 1MBIT 90NS 32PLCC
Manufacturer
ON Semiconductor
Datasheet

Specifications of CAT28F010GI90

Format - Memory
FLASH
Memory Type
FLASH
Memory Size
1M (128K x 8)
Speed
90ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Package / Case
32-PLCC
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
CAT28F010GI-90
CAT28F010GI-90

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
CAT28F010GI90
Manufacturer:
ON Semiconductor
Quantity:
135
Part Number:
CAT28F010GI90
Manufacturer:
ON Semiconductor
Quantity:
10 000
SUPPLY CHARACTERISTICS
A.C. CHARACTERISTICS, Read Operation
V
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) Output floating (High-Z) is defined as the state where the external data line is no longer driven by the output buffer.
(3) Input Rise and Fall Times (10% to 90%) < 10 ns.
(4) Input Pulse Levels = 0.45V and 2.4V. For High Speed Input Pulse Levels 0.0V and 3.0V.
(5) Input and Output Timing Reference = 0.8V and 2.0V. For High Speed Input and Output Timing Reference = 1.5V.
(6) Low-Z is defined as the state where the external data may be driven by the output buffer but may not be valid.
(7)
© 2009 SCILLC. All rights reserved.
Characteristics subject to change without notice
JEDEC Standard
Symbol Symbol
t
WHGL
CC
t
t
t
t
t
t
t
t
t
AVQV
GLQV
AXQX
GLQX
GHQZ
EHQZ
AVAV
ELQV
ELZX
For load and reference points, see Fig. 1
Symbol
= +5V 10%, unless otherwise specified.
V
V
V
(1)
CC
PPL
PPH
t
t
t
OLZ
t
DF
DF
LZ
t
t
t
ACC
t
t
RC
OE
OH
CE
(1)(6)
(1)(2)
(1)(2)
(1)(6)
-
Parameter
Read Cycle Time
CE Access Time
Address Access Time
OE Access Time
Output Hold from Address OE/CE Change
OE to Output in Low-Z
CE to Output in Low-Z
OE High to Output High-Z
CE High to Output High-Z
Write Recovery Time Before Read
V
V
V
CC
PP
PP
During Read Operations
During Read/Erase/Program
Supply Voltage
Figure 1. A.C. Testing Input/Output Waveform
0.45 V
2.4 V
DEVICE
UNDER
TEST
Parameter
Testing Load Circuit (example)
INPUT PULSE LEVELS
5108 FHD F04
1.3V
1N914
3.3K
C L = 100 pF
5
2.0 V
0.8 V
C L INCLUDES JIG CAPACITANCE
OUT
REFERENCE POINTS
Min
90
28F010-90
0
0
0
6
11.4
Min
4.5
0
Max
90
90
35
20
30
(7)
5108 FHD F03
Limits
(3)(4)(5)
28F010-12
Min
120
0
0
0
6
Max.
12.6
5.5
6.5
120
120
Max
50
30
40
(7)
Doc. No. MD-1019, Rev. G
CAT28F010
Unit
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
V
V
V
s

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