AT29LV512-25JI Atmel, AT29LV512-25JI Datasheet - Page 5

IC FLASH 512KBIT 250NS 32PLCC

AT29LV512-25JI

Manufacturer Part Number
AT29LV512-25JI
Description
IC FLASH 512KBIT 250NS 32PLCC
Manufacturer
Atmel
Datasheet

Specifications of AT29LV512-25JI

Format - Memory
FLASH
Memory Type
FLASH
Memory Size
512K (64K x 8)
Speed
250ns
Interface
Parallel
Voltage - Supply
3 V ~ 3.6 V
Operating Temperature
-40°C ~ 85°C
Package / Case
32-PLCC
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
AT29LV51225JI

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AT29LV512-25JI
Manufacturer:
ATMEL
Quantity:
6 988
Part Number:
AT29LV512-25JI
Manufacturer:
Atmel
Quantity:
10 000
4.7
4.8
5. Absolute Maximum Ratings*
0177O–FLASH–9/08
Temperature Under Bias ............................... -55C to +125C
Storage Temperature..................................... -65C to +150C
All Input Voltages (including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to V
Voltage on A9 (including NC Pins)
with Respect to Ground ...................................-0.6V to +13.5V
Toggle Bit
Optional Chip Erase Mode
In addition to DATA polling, the AT29LV512 provides another method for determining the end of
a program or erase cycle. During a program or erase operation, successive attempts to read
data from the device will result in I/O6 toggling between one and zero. Once the program cycle
has completed, I/O6 will stop toggling and valid data will be read. Examining the toggle bit may
begin at any time during a program cycle.
The entire device can be erased by using a 6-byte software code. Please see Software Chip
Erase application note for details.
CC
+ 0.6V
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability
AT29LV512
5

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