STK14C88-NF25I Cypress Semiconductor Corp, STK14C88-NF25I Datasheet - Page 9

IC NVSRAM 256KBIT 25NS 32SOIC

STK14C88-NF25I

Manufacturer Part Number
STK14C88-NF25I
Description
IC NVSRAM 256KBIT 25NS 32SOIC
Manufacturer
Cypress Semiconductor Corp
Type
NVSRAMr
Datasheets

Specifications of STK14C88-NF25I

Format - Memory
RAM
Memory Type
NVSRAM (Non-Volatile SRAM)
Memory Size
256K (32K x 8)
Speed
25ns
Interface
Parallel
Voltage - Supply
4.5 V ~ 5.5 V
Operating Temperature
-40°C ~ 85°C
Package / Case
32-SOIC (7.5mm Width)
Word Size
8b
Organization
32Kx8
Density
256Kb
Interface Type
Parallel
Access Time (max)
25ns
Operating Supply Voltage (typ)
5V
Package Type
SOIC
Operating Temperature Classification
Industrial
Operating Supply Voltage (max)
5.5V
Operating Supply Voltage (min)
4.5V
Operating Temp Range
-40C to 85C
Pin Count
32
Mounting
Surface Mount
Supply Current
100mA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
STK14C88-NF25I
Manufacturer:
SIMTEK
Quantity:
20 000
Data Retention and Endurance
Capacitance
In the following table, the capacitance parameters are listed.
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
AC Test Conditions
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <5 ns
Input and Output Timing Reference Levels ................... 1.5 V
Note
Document Number: 001-50592 Rev. *B
DATA
NV
C
C
8. These parameters are guaranteed by design and are not tested.
IN
OUT
Parameter
C
Θ
Θ
R
Parameter
Parameter
JA
JC
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Description
Input Capacitance
Output Capacitance
Data Retention
Nonvolatile STORE Operations
Description
Output
3.3V
Description
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA / JESD51.
30 pF
Figure 6. AC Test Loads
T
V
A
CC
[8]
= 25°C, f = 1 MHz,
Test Conditions
= 0 to 3.0 V
R1 317Ω
[8]
Test Conditions
351Ω
R2
1,000
Min
100
32-SOIC
TBD
TBD
Max
5
7
STK14C88-3
32-PDIP
TBD
TBD
Page 9 of 17
Years
Unit
Unit
K
pF
pF
°C/W
°C/W
Unit
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