LAL03TA102K Taiyo Yuden, LAL03TA102K Datasheet - Page 22

• Manufacturer Part Number: LAL03TA102K
• Description: INDUCTOR 1000UH 40MA AXIAL LEAD
• Manufacturer: Taiyo Yuden

Specifications of LAL03TA102K

• Inductance: 1mH
• Current: 40mA
• Tolerance: ±10%
• Dc Resistance (dcr): 33 Ohm Max
• Self Resonant Freq: 1.4MHz
• Package / Case: Axial
• Mounting Type: Through Hole
• Operating Temperature: -25°C ~ 105°C
• Frequency - Test: 796kHz
• Applications: General Purpose
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Shielding: -
• Q @ Freq: -
• Current - Saturation: -
• Current - Temperature Rise: -

27.Low temperature life test
28.High temperature life test
RELIABILITY DATA
Item
LA02 Type/
LA03 Type
△L/LD
WithinM10L
QD30min.
△L/LD
WithinM10L
△Q/QD
WithinM30L
LA04 Type
△L/LD
WithinM10L
QD15min.
LA05 Type
LHL□□□/
LHF15BB/
LHFP□□BB
AppearanceD
No abnor-
mality
Inductance
changeD
WithinM10L
Q changeD
WithinM30L
AppearanceD
No abnor-
mality
Inductance
changeD
WithinM10L
Q changeD
WithinM30L
Specified Value
FBA/FBR
△L/LD
WithinM10L
QD20min.
LAV35
Refer to
i n d i v i d u a l
specifica-
tion
Refer to
i n d i v i d u a l
specifica-
tion
FL05□
Type
AppearanceD
No abnor-
mality
Impedance
changeD
WithinM20L
AppearanceD
No abnor-
mality
Impedance
changeD
WithinM20L
FL06BT
Type
LAD
TemperatureDK25M2C
DurationD1000 hrs
RecoveryDAt least 1hr of recovery under the standard re-
LHLYLHFYLHFPD
TemperatureDK40M3C
DurationD1000M24 hrs
RecoveryD1 to 2hrs of recovery under the standard con-
LAV35D
TemperatureDK40M3C
DurationD1000 hrs
RecoveryDAt least 1hr of recovery under the standard re-
FLD
TemperatureDK40M3C
DurationD500fJ12, K0ghrs
RecoveryD1 to 2hrs of recovery under the standard con-
LHLYLHFYLHFPD
TemperatureD105M3C
DurationD1000M24 hrs
RecoveryD1 to 2hrs of recovery under the standard con-
FLD
TemperatureD85M3C
DurationD500fJ12, K0ghrs
RecoveryD1 to 2hrs of recovery under the standard con-
moval from test chamber, followed by the mea-
surement within 2hrs.
moval from test chamber, followed by the mea-
surement within 2hrs.
dition after the removal from the test cfamber.
dition after the removal from the test cfamber.
dition after the removal from the test cfamber.
dition after the removal from the test cfamber.
Test Method and Remarks
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