TS80C32X2-VCB Atmel, TS80C32X2-VCB Datasheet - Page 36

IC MCU 8BIT 40/20MHZ 44-PLCC

TS80C32X2-VCB

Manufacturer Part Number
TS80C32X2-VCB
Description
IC MCU 8BIT 40/20MHZ 44-PLCC
Manufacturer
Atmel
Series
80Cr
Datasheet

Specifications of TS80C32X2-VCB

Core Processor
8051
Core Size
8-Bit
Speed
60/30MHz
Connectivity
UART/USART
Peripherals
POR
Number Of I /o
32
Program Memory Type
ROMless
Ram Size
256 x 8
Voltage - Supply (vcc/vdd)
4.5 V ~ 5.5 V
Oscillator Type
Internal
Operating Temperature
0°C ~ 70°C
Package / Case
44-PLCC
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-
Program Memory Size
-
Data Converters
-

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Electrical
Characteristics
Absolute Maximum
Ratings
Power Consumption
Measurement
DC Parameters for
Standard Voltage
Table 22. DC Parameters in Standard Voltage
36
Ambiant Temperature Under Bias:
C = commercial......................................................0°C to 70°C
I = industrial ........................................................-40°C to 85°C
Storage Temperature .................................... -65°C to + 150°C
Voltage on V
Voltage on V
Voltage on Any Pin to V
Power Dissipation ........................................................... 1 W
Symbol
V
V
V
V
V
V
OL1
OL2
IH1
OL
IH
IL
(1)
TS8xCx2X2
Parameter
Input Low Voltage
Input High Voltage except XTAL1, RST
Input High Voltage, XTAL1, RST
Output Low Voltage, ports 1, 2, 3
Output Low Voltage, port 0
Output Low Voltage, ALE, PSEN
CC
PP
to V
to V
SS
SS
.........................................-0.5V to + 7 V
.......................................-0.5V to + 13 V
SS
..........................-0.5V to V
(6)
Since the introduction of the first C51 devices, every manufacturer made operating Icc
measurements under reset, which made sense for the designs were the CPU was run-
ning under reset. In Atmel new devices, the CPU is no more active during reset, so the
power consumption is very low but is not really representative of what will happen in the
customer system. That’s why, while keeping measurements under Reset, Atmel pre-
sents a new way to measure the operating Icc:
Using an internal test ROM, the following code is executed:
Label:
Ports 1, 2, 3 are disconnected, Port 0 is tied to FFh, EA = Vcc, RST = Vss, XTAL2 is not
connected and XTAL1 is driven by the clock.
This is much more representative of the real operating Icc.
T
T
A
A
= 0°C to +70°C; V
= -40°C to +85°C; V
(6)
CC
+ 0.5V
(2)
SS
SJMP Label (80 FE)
0.2 V
SS
= 0 V; V
0.7 V
= 0 V; V
Min
-0.5
CC
CC
+ 0.9
Notes:
CC
CC
= 5V ± 10%; F = 0 to 40 MHz.
= 5V ± 10%; F = 0 to 40 MHz.
Typ
1.
2. This value is based on the maximum allowable die
S
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions above those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions may affect device reliability.
temperature and the thermal resistance of the
package.
tresses at or above those listed under “ Absolute
0.2 V
V
V
CC
CC
Max
0.45
0.45
0.45
0.3
1.0
0.3
1.0
0.3
1.0
CC
+ 0.5
+ 0.5
- 0.1
Unit
V
V
V
V
V
V
V
V
V
V
V
V
Test Conditions
I
I
I
I
I
I
I
I
I
OL
OL
OL
OL
OL
OL
OL
OL
OL
= 100 μA
= 200 μA
= 100 μA
4184G–8051–09/06
= 1.6 mA
= 3.5 mA
= 3.2 mA
= 7.0 mA
= 1.6 mA
= 3.5 mA
(4)
(4)
(4)
(4)
(4)
(4)
(4)
(4)
(4)

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