SP232EEP-L Exar Corporation, SP232EEP-L Datasheet - Page 7

• Manufacturer Part Number: SP232EEP-L
• Description: IC DVR/RCVR RS232 ESD 16PDIP
• Manufacturer: Exar Corporation
• Type: Transceiverr

Specifications of SP232EEP-L

• Package / Case: 16-DIP (0.300", 7.62mm)
• Number Of Drivers/receivers: 2/2
• Protocol: RS232
• Voltage - Supply: 4.5 V ~ 5.5 V
• Mounting Type: Through Hole
• Operating Supply Voltage: 5 V
• Supply Current: 3 mA
• Operating Temperature Range: - 40 C to + 85 C
• Mounting Style: Through Hole
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant
• Other names: 1016-1030-5

ESD ToLERAnCE
The SP202E, 232E, 233E, 30E and 32E
devices incorporates ruggedized ESD cells on
all driver outputs and receiver input pins. The
ESD structure is improved over our previous
family for more rugged applications and envi-
ronments sensitive to electro-static discharges
and associated transients. The improved ESD
tolerance is at least +/-5kV Human Body
Model without damage nor latch-up.
The Human Body Model has been the gener-
ally accepted ESD testing method for semi-
conductors. This method is also specified in
MIL-STD-883, Method 305.7 for ESD testing.
Figure . Charge pump phases
Exar Corporation 48720 Kato Road, Fremont CA, 94538 • (50)668-7000 • www.exar.com SP202E,232E,233E, 30E, 32E_00_0608
C
1
+
+
V
-
CC
Phases 1 and 3: Store/Double.
Double charge from C 1 onto C2.
C 2 is now charged to -2xVcc
C
2
e
e
-
-
+
V+
V-
+
+
C
C
3
4
7
The premise of this ESD test is to simulate
the human body's potential to store electro-
static energy and discharge it to an intergrated
circuit. The simulation is peformed by using a
test model as shown in figure 2. This method
will test the IC's capability to withstand an ESD
transient during normal handling such as in
manufacturing areas where the IC's tend to be
handled frequently.
Figure 2. ESD test circuit for Human Body
Model
DC Power
Source
Patented 5,306,954
C
C
1
1
R
e
-
C
e
-
+
+
+
+
-
V
-
V
CC
CC
SW1
Meanwhile C1 is charged to Vcc
Phase 2 – Vss transfer from C2 to C4.
Meanwhile C 1 is charged to Vcc
Phase 4 V
C
C
2
2
C
e
DD
V
+
S
+
+
Vss
DD
e
transfer from C2 to C3.
-
e
R
DESCRiPTion
+
S
V+
V-
V+
e
-
+
+
+
+
C
C
C
C
SW2
3
4
3
4
Device
Under
Test