ATA555812C-DDB Atmel, ATA555812C-DDB Datasheet - Page 37

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ATA555812C-DDB

Manufacturer Part Number
ATA555812C-DDB
Description
IC IDIC 1KBIT R/W DIE
Manufacturer
Atmel
Datasheet

Specifications of ATA555812C-DDB

Function
Read/Write
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
9. Electrical Characteristics (Continued)
T
4681E–RFID–11/09
*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data
Notes:
amb
No. Parameters
9.1
9.2
9.3
10
7
8
= +25°C, f
Programming time
Endurance
Data retention
Resonance capacitor
1. EEPROM device performance can be influenced by subsequent customer assembly processes especially if subjected to
2. Current into Coil 1/Coil 2 is limited to 10 mA. The damping characteristics are defined by the internally limited supply volt-
3. I
4. V
5. The tolerance of the on-chip resonance capacitor is ±12% at 3s over whole production. The capacitor tolerance is
high temperatures or mechanical stress conditions. So Atmel confirms these parameters only for devices as they leave the
Atmel production, as sawn wafers on foil or diced wafers in tray, etc.
age (= minimum AC coil voltage).
I
±3% at 3 on a wafer basis.
DD
DD
mod
coil
measurement setup R = 100 k ; V
= (V
= 125 kHz; unless otherwise specified
measurement setup: R = 1 k ; V
OUTmax
– V
Figure 9-1.
CLK
)/R
Test Conditions
From last command gap to
SOF pattern
(36 + 648 internal clocks)
Erase all/Write all
Top = 55 C
Top = 150 C
Top = 250 C
Mask option
Measurement Setup for V
(1)
(5)
(1)
(1)
CLK
CLK
V
CLK
(1)
= 3 V; setup with modulation enabled (see
= 3V: EEPROM programmed to 00 ... 000 (erase all); NRZ, public mode.
R
+
-
Symbol
t
t
t
retention
retention
retention
n
T
cycle
Cr
prog
mod
100000
750
750
Min.
185
BAT68
BAT68
10
96
24
70
5
Coil 1
ATA5558
Coil 2
Figure 9-1 on page
Typ.
210
5.7
20
80
Max.
235
50
90
Substrate
6
ATA5558
37).
Cycles
Years
Unit
hrs
hrs
ms
pF
pF
Type*
Q
Q
T
T
T
T
37

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