ADXL320JCP Analog Devices Inc, ADXL320JCP Datasheet - Page 4

IC, 2 AXIS ACCELEROMETER, ± 5G, LFCSP-16

ADXL320JCP

Manufacturer Part Number
ADXL320JCP
Description
IC, 2 AXIS ACCELEROMETER, ± 5G, LFCSP-16
Manufacturer
Analog Devices Inc
Series
iMEMS®r
Datasheet

Specifications of ADXL320JCP

No. Of Axes
2
Sensor Case Style
LFCSP
No. Of Pins
16
Supply Voltage Range
2.4V To 5.25V
Operating Temperature Range
-20°C To +70°C
Msl
MSL 1 - Unlimited
Acceleration Range
± 5g
Axis
X, Y
Sensitivity
174mV/g
Voltage - Supply
2.4 V ~ 5.25 V
Output Type
Analog
Bandwidth
1Hz ~ 500Hz Selectable
Mounting Type
Surface Mount
Package / Case
16-LQFN, CSP Exposed Pad
Rohs Compliant
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
For Use With
ADXL320EB - BOARD EVAL FOR ADXL320
Interface
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
Q2045089

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ADXL320
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
Acceleration (Any Axis, Unpowered)
Acceleration (Any Axis, Powered)
V
All Other Pins
Output Short-Circuit Duration
(Any Pin to Common)
Operating Temperature Range
Storage Temperature
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate
on the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
S
Rating
10,000 g
10,000 g
−0.3 V to +7.0 V
(COM − 0.3 V) to
(V
Indefinite
−55°C to +125°C
−65°C to +150°C
S
+ 0.3 V)
Rev. 0 | Page 4 of 16
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.

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