HCPL0600R1 Fairchild Semiconductor, HCPL0600R1 Datasheet - Page 5

• Manufacturer Part Number: HCPL0600R1
• Description: High Speed Optocouplers 10MBit Optocoupler HS Logic Gate
• Manufacturer: Fairchild Semiconductor

Specifications of HCPL0600R1

• Input Type: DC
• Isolation Voltage: 3750 Vrms
• Maximum Continuous Output Current: 50 mA
• Maximum Fall Time: 12 ns
• Maximum Forward Diode Current: 50 mA
• Maximum Rise Time: 50 ns
• Output Device: Logic Gate Photo IC
• Configuration: 1 Channel
• Maximum Baud Rate: 10 MBps
• Maximum Forward Diode Voltage: 1.75 V
• Maximum Reverse Diode Voltage: 5 V
• Maximum Input Diode Current: 50 mA
• Maximum Power Dissipation: 85 mW
• Maximum Operating Temperature: + 85 C
• Minimum Operating Temperature: - 40 C
• Package / Case: SOIC-8 Wide
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: HCPL0600R1_NL

©2006 Fairchild Semiconductor Corporation
HCPL06XX Rev. 1.0.8
Transfer Characteristics
Isolation Characteristics
*All typical values are at V
Notes:
1. The V
2. Enable Input – No pull up resistor required as the device has an internal pull up resistor.
3. t
4. t
5. t
6. t
7. t
8. t
9. CM
10. CM
11. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted
Symbol
Symbol
V
or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible
to the package V
pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
voltage pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
voltage pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
state (i.e., V
output state (i.e., V
together.
I
I
PLH
PHL
r
f
ELH
EHL
OH
V
R
C
FT
OL
I
– Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
– Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
I-O
ISO
I-O
I-O
H
L
– Propagation delay is measured from the 3.75mA level on the HIGH to LOW transition of the input current
– Propagation delay is measured from the 3.75mA level on the LOW to HIGH transition of the input current
– Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input
– Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input
– The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low
– The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high
CC
High Level Output Current
Low Level Output Voltage
Input Threshold Current
supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic
DC Characteristics
Input-Output
Insulation Leakage Current
Withstand Insulation Test Voltage
Resistance (Input to Output)
Capacitance (Input to Output)
OUT
> 2.0V). Measured in volts per microsecond (V/µs).
Characteristics
CC
OUT
CC
and GND pins of each device.
= 5 V, T
< 0.8V). Measured in volts per microsecond (V/µs).
(T
(T
A
A
A
= -40°C to +85°C unless otherwise specified.)
= -40°C to +85°C unless otherwise specified.)
= 25°C
V
V
I
V
I
V
OL
OL
CC
CC
CC
E
= 13mA
= 13mA
= 2.0V
= 5.5V, V
= 5.5V, I
= 5.5V, V
V
f = 1MHz
Relative humidity = 45%,
T
V
I
R
I-O
Test Conditions
A
I-O
I-O
H
(2)
= 25°C, t = 5s,
Test Conditions
(2)
< 50%, T
= 3000 VDC
= 500V
F
O
O
2µA, t = 1 min.
= 5mA, V
= 5.5 V, I
= 0.6V, V
(11)
(11)
5
A
= 25°C,
E
F
E
(11)
= 2.0V,
= 250µA,
= 2.0V,
(11)
Min.
3750
Min.
Typ.*
10
0.6
Typ.*
12
Max.
1.0*
Max.
100
0.6
5
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Unit
V
Unit
µA
RMS
pF
mA
µA
V