ADIS16367BMLZ Analog Devices Inc, ADIS16367BMLZ Datasheet - Page 15

• Manufacturer Part Number: ADIS16367BMLZ
• Description: Extended Dynamic Range 6 DoF Sensor
• Manufacturer: Analog Devices Inc

Specifications of ADIS16367BMLZ

• Output Type: *
• Sensor Type: *
• Lead Free Status / RoHS Status: Lead free / RoHS compliant by exemption

DIAGNOSTICS
Self-Test
The self-test function allows the user to verify the mechanical
integrity of each MEMS sensor. It applies an electrostatic force to
each sensor element, which results in mechanical displacement that
simulates a response to actual motion. Table 1 lists the expected
response for each sensor, which provides pass/fail criteria.
Set MSC_CTRL[10] = 1 (DIN = 0xB504) to run the internal
self-test routine, which exercises all inertial sensors, measures
each response, makes pass/fail decisions, and reports them to
error flags in the DIAG_STAT register. MSC_CTRL[10] resets
itself to 0 after completing the routine. The MSC_CTRL[9:8] bits
provide manual control over the self-test function for
investigation of potential failures. Table 25 outlines an example
test flow for using this option to verify the x-axis gyroscope
function.
Table 25. Manual Self-Test Example Sequence
DIN
0xB601
0xB904
0xB802
0x0400
0xB502
0x0400
0xB501
0x0400
0xB500
Zero motion provides results that are more reliable. The settings
in Table 25 are flexible and allow for optimization around speed
and noise influence. For example, using fewer filtering taps decreases
delay times but increases the possibility of noise influence.
Description
SMPL_PRD[7:0] = 0x01, sample rate = 819.2 SPS
SENS_AVG[15:8] = 0x04, gyro range = ±1200°/sec
SENS_AVG[7:0] = 0x02, four-tap averaging filter
Delay = 50 ms
Read XGYRO_OUT
MSC_CTRL[9] = 1, gyroscope negative self-test
Delay = 50 ms
Read XGYRO_OUT
Determine whether the bias in the gyroscope
output change according to the self-test response
specified in Table 1
MSC_CTRL[9:8] = 01, gyroscope/accelerometer
positive self-test
Delay = 50 ms
Read XGYRO_OUT
Determine whether the bias in the gyroscope
output changed according to the self-test
response specified in Table 1
MSC_CTRL[15:8] = 0x00
Rev. A | Page 15 of 20
Memory Test
Setting MSC_CTRL[11] = 1 (DIN = 0xB508) performs a
checksum verification of the flash memory locations. The
pass/fail result is loaded into DIAG_STAT[6].
Status
The error flags provide indicator functions for common system
level issues. All of the flags are cleared (set to 0) after each
DIAG_STAT register read cycle. If an error condition remains,
the error flag returns to 1 during the next sample cycle. The
DIAG_STAT[1:0] bits do not require a read of this register to
return to 0. If the power supply voltage goes back into range,
these two flags are cleared automatically.
Table 26. DIAG_STAT Bit Descriptions
Bit
[15]
[14]
[13]
[12]
[11]
[10]
[9]
[8]
[7]
[6]
[5]
[4]
[3]
[2]
[1]
[0]
Description (Default = 0x0000)
Z-axis accelerometer self-test failure (1 = fail, 0 = pass)
Y-axis accelerometer self-test failure (1 = fail, 0 = pass)
X-axis accelerometer self-test failure (1 = fail, 0 = pass)
Z-axis gyroscope self-test failure (1 = fail, 0 = pass)
Y-axis gyroscope self-test failure (1 = fail, 0 = pass)
X-axis gyroscope self-test failure (1 = fail, 0 = pass)
Alarm 2 status (1 = active, 0 = inactive)
Alarm 1 status (1 = active, 0 = inactive)
Not used
Flash test, checksum flag (1 = fail, 0 = pass)
Self-test diagnostic error flag (1 = fail, 0 = pass)
Sensor overrange (1 = fail, 0 = pass)
SPI communication failure (1 = fail, 0 = pass)
Flash update failure (1 = fail, 0 = pass)
Power supply > 5.25 V (1 = power supply > 5.25 V,
0 = power supply ≤ 5.25 V)
Power supply < 4.75 V (1 = power supply < 4.75 V,
0 = power supply ≥ 4.75 V)
ADIS16367