08055A102FAT2A AVX Corporation, 08055A102FAT2A Datasheet - Page 2

• Manufacturer Part Number: 08055A102FAT2A
• Description: Cap Ceramic 0.001uF 50VDC C0G 1% SMD 0805 Paper T/R
• Manufacturer: AVX Corporation
• Type: Flatr

Specifications of 08055A102FAT2A

• Package/case: 0805
• Mounting: Surface Mount
• Capacitance Value: 0.001 uF
• Dielectric: C0G
• Voltage: 50 Vdc
• Product Length: 2.01 mm
• Product Height: 0.94(Max) mm
• Product Depth: 1.25 mm
• Tolerance: 1 %
• Capacitance: 1000pF
• Voltage - Rated: 50V
• Temperature Coefficient: C0G, NP0
• Mounting Type: Surface Mount, MLCC
• Operating Temperature: -55°C ~ 125°C
• Applications: General Purpose
• Package / Case: 0805 (2012 Metric)
• Size / Dimension: 0.079" L x 0.049" W (2.00mm x 1.25mm)
• Thickness: 0.94mm Max
• Dielectric Characteristic: C0G / NP0
• Capacitance Tolerance: ± 1%
• Voltage Rating: 50VDC
• Capacitor Case Style: 0805
• No. Of Pins: 2
• Capacitor Mounting: SMD
• Rohs Compliant: Yes
• Case Size: 0805
• Material, Element: Ceramic
• Termination: SMT
• Voltage, Rating: 50 VDC
• Tolerance (+ Or -): 1%
• Temp Coeff (dielectric): C0G
• Operating Temp Range: -55C to 125C
• Mounting Style: Surface Mount
• Construction: SMT Chip
• Case Style: Ceramic Chip
• Failure Rate: Not Required
• Wire Form: Not Required
• Product Length (mm): 2.01mm
• Product Depth (mm): 1.25mm
• Product Height (mm): 0.94mm
• Product Diameter (mm): Not Requiredmm
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Features: -
• Ratings: -
• Lead Spacing: -
• Lead Free Status / Rohs Status: RoHS Compliant part
• Other names: 478-3759-2

C0G (NP0) Dielectric
Specifications and Test Methods
Resistance to
Resistance to
Operating Temperature Range
Solder Heat
Load Life
Humidity
Stresses
Thermal
Flexure
Shock
Load
Insulation Resistance
Dielectric Strength
Parameter/Test
Capacitance
Solderability
Q
(C=Nominal Cap)
Capacitance
Capacitance
Capacitance
Capacitance
Capacitance
Appearance
Appearance
Appearance
Appearance
Appearance
Resistance
Resistance
Resistance
Resistance
Resistance
Insulation
Insulation
Insulation
Insulation
Insulation
Dielectric
Dielectric
Dielectric
Dielectric
Variation
Variation
Strength
Variation
Strength
Variation
Strength
Variation
Strength
Q
Q
Q
Q
Q
No defects, <25% leaching of either end terminal
≥ 95% of each terminal should be covered
≥10 pF, <30 pF:
≥10 pF, <30 pF:
≤ ±2.5% or ±.25 pF, whichever is greater
≤ ±2.5% or ±.25 pF, whichever is greater
≤ ±3.0% or ± .3 pF, whichever is greater
≤ ±5.0% or ± .5 pF, whichever is greater
±5% or ±.5 pF, whichever is greater
<30 pF: Q≥ 400+20 x Cap Value
No breakdown or visual defects
≥ Initial Value x 0.3 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
100,000MΩ or 1000MΩ - μF,
NP0 Specification Limits
≥ 30 pF:
≥ 30 pF:
Within specified tolerance
<10 pF:
<10 pF:
≥ Initial Value x 0.3
No visual defects
≥30 pF: Q≥ 1000
-55ºC to +125ºC
whichever is less
with fresh solder
No visual defects
No visual defects
No defects
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
1-5 seconds, w/charge and discharge current
seconds. Store at room temperature for 24 ± 2
Charge device with 300% of rated voltage for
hours before measuring electrical properties.
Dip device in eutectic solder at 260ºC for 60
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +125ºC ± 2º
Step 4: Room Temp
Repeat for 5 cycles and measure after
24 hours at room temperature
Remove from test chamber and stabilize at
Dip device in eutectic solder at 230 ± 5ºC
85% ± 5% relative humidity for 1000 hours
Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
Store in a test chamber set at 85ºC ± 2ºC/
Note: Charge device with 150% of rated
Charge device with twice rated voltage in
Remove from chamber and stabilize at
Charge device with rated voltage for
(+48, -0) with rated voltage applied.
60 ± 5 secs @ room temp/humidity
room temperature for 24 ± 2 hours
test chamber set at 125ºC ± 2ºC
room temperature for 24 hours
Temperature Cycle Chamber
1.0 kHz ± 10% for cap > 1000 pF
voltage for 500V devices.
Measuring Conditions
for 1000 hours (+48, -0).
Voltage: 1.0Vrms ± .2V
Test Time: 30 seconds
limited to 50 mA (max)
for 5.0 ± 0.5 seconds
before measuring.
before measuring.
Deflection: 2mm
90 mm
1mm/sec
30 ± 3 minutes
≤ 3 minutes
30 ± 3 minutes
≤ 3 minutes
5